31.020 : Electronic components in general

DIN IEC CMC(CO)44:1989-07

DIN IEC CMC(CO)44:1989-07

Withdrawn Most Recent

IEC quality assessment system for electronic components (IECQ); primary stage of manufacture; amendment to rules of procedure; identical with IEC CMC(Central Office)44

€34.30

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UNE 20501-2-9/1C:1989

UNE 20501-2-9/1C:1989

Superseded Historical

BASIC ENVIRONMENTAL TESTING PROCEDURES. GUIDANCE FOR SOLAR RADIATION TESTING

€16.00

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UTE C93-024/A2, C93-024/A2U (03/1989)

UTE C93-024/A2, C93-024/A2U (03/1989)

Withdrawn Most Recent

Additif 2 à la publication UTE C 93-024 de septembre 1980

€59.33

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PD 9002:1989

PD 9002:1989

Withdrawn Most Recent

BS 9000, BS CECC and IECQ qualified products list

€269.00

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BS 6062-2:1988

BS 6062-2:1988

Superseded Historical

Packaging of electronic components for automatic handling Specification tape packaging with unidirectional leads on continuous tapes

€269.00

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BS 6062-3:1988

BS 6062-3:1988

Superseded Historical

Packaging of electronic components for automatic handling. Specification packaging leadless on continuous tapes

€165.00

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BS 6943:1988

BS 6943:1988

Withdrawn Most Recent

Classification of shapes of electronic components for placement on printed wiring boards

€404.00

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BS CECC 00800:1988

BS CECC 00800:1988

Withdrawn Most Recent

Harmonized system of quality assessment for electronic components. Code of practice for the use of the ppm approach in association with the CECC system

€193.00

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DIN IEC QC 001001:1988-02

DIN IEC QC 001001:1988-02

Withdrawn Most Recent

IEC quality assessment system for electronic components (IECQ); basic rules; identical with IEC QC 001001, edition 1986

€63.27

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DIN IEC QC 001002:1988-02

DIN IEC QC 001002:1988-02

Withdrawn Most Recent

IEC quality assessment system for electronic components (IECQ); rules of procedure; identical with IEC QC 001002, edition 1986

€111.40

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DIN IEC QC 001002 Beiblatt 1:1988-02

DIN IEC QC 001002 Beiblatt 1:1988-02

Withdrawn Most Recent

Specification structures for the IEC quality assessment system for electronic components (IECQ); identical with IEC Guide 102, edition 1979

€63.27

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ASTM E1250-88(2005)

ASTM E1250-88(2005)

Superseded Historical

Standard Test Method for Application of Ionization Chambers to Assess the Low Energy Gamma Component of Cobalt-60 Irradiators Used in Radiation-Hardness Testing of Silicon Electronic Devices

This product is not for sale, please contact us for more information

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ASTM E1250-88(2000)

ASTM E1250-88(2000)

Superseded Historical

Standard Test Method for Application of Ionization Chambers to Assess the Low Energy Gamma Component of Cobalt-60 Irradiators Used in Radiation-Hardness Testing of Silicon Electronic Devices

This product is not for sale, please contact us for more information

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BS 5783:1987

BS 5783:1987

Superseded Historical

Code of practice for handling of electrostatic sensitive devices

€193.00

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BS 9000-1:1981

BS 9000-1:1981

Superseded Historical

General requirements for a system electronic components of assessed quality Specification basic rules and procedures

€269.00

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