Optics and photonics. Holography Methods for measurement of hologram recording characteristics
€255.00
Process management for avionics. Aerospace qualified electronic components (AQEC) Integrated circuits and discrete semiconductors
€193.00
Process management for avionics. Electronic components aerospace, defence and high performance (ADHP) applications General requirements passive
€374.00
Standard Practice for Using the Morphological Key for the Rapid Identification of Fibers for Contamination Control in Electron Devices and Microelectronics (Withdrawn 2005)
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Standard Test Method for Fluid and Grease Resistance of Thermoset Encapsulating Compounds Used in Electronic and Microelectronic Applications
Standard Test Method for Combined Fine and Gross Leaks for Large Hybrid Microcircuit Packages
Standard Guide for Neutron Irradiation of Unbiased Electronic Components
Standard Guide for Analysis of Overtest Data in Radiation Testing of Electronic Parts
Specification for Nickel Alloy Cathode Sleeves for Electron Devices (Withdrawn 1992)
Test Method for Embedment Stress Caused by Casting Compounds on Glass-Encased Electronic Components (Withdrawn 1997)
Standard Practice for Application of Thermoluminescence-Dosimetry (TLD) Systems for Determining Absorbed Dose in Radiation-Hardness Testing of Electronic Devices
Standard Test Method for Application of Ionization Chambers to Assess the Low Energy Gamma Component of Cobalt-60 Irradiators Used in Radiation-Hardness Testing of Silicon Electronic Devices
Standard Practices for Determining Hermeticity of Electron Devices by Dye Penetration (Withdrawn 2008)
Safety of machinery. related parts control systems General principles for design
€269.00
