17.040 : Linear and angular measurements

17.040.01

Linear and angular measurements in general

17.040.10

Limits and fits

17.040.20

Properties of surfaces

17.040.30

Measuring instruments

17.040.40

Geometrical Product Specification (GPS)

17.040.99

Other standards related to linear and angular measurements
ASTM E1836-98

ASTM E1836-98

Superseded Historical

Standard Classification for Building Floor Area Measurements for Facility Management

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ASTM E1182-01

ASTM E1182-01

Withdrawn Most Recent

Standard Test Method for Measurement of Surface Layer Thickness by Radial Sectioning (Withdrawn 2002)

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ASTM E1836-01

ASTM E1836-01

Superseded Historical

Standard Classification for Building Floor Area Measurements for Facility Management

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VDI/VDE 2617 Blatt 2.3:2001-12

VDI/VDE 2617 Blatt 2.3:2001-12

Superseded Historical

Accuracy of coordinate measuring machines - Parameters and their reverification - Acceptance and reverification test for coordinate measuring machines of large dimensions

€71.85

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VDI/VDE 2631 Blatt 6:2001-12

VDI/VDE 2631 Blatt 6:2001-12

Superseded Historical

Form measurement - Determination of the straightness deviation of the linear guide

€51.99

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VDI/VDE/DGQ 2618 Blatt 1.1:2001-12 (R2015)

VDI/VDE/DGQ 2618 Blatt 1.1:2001-12 (R2015)

Superseded Historical

Inspection of measuring and test equipment - Instructions to inspect measuring and test equipment for geometrical quantities - Basic principals.

€95.21

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VDI/VDE 2631 Blatt 2:2001-12

VDI/VDE 2631 Blatt 2:2001-12

Superseded Historical

Form measurement - Determination of the sensitivity of the signal transmission chain

€95.21

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VDI/VDE 2631 Blatt 8:2001-12

VDI/VDE 2631 Blatt 8:2001-12

Superseded Historical

Form measurement - Stability monitoring of form measuring systems

€71.85

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ASTM C835-01

ASTM C835-01

Superseded Historical

Standard Test Method for Total Hemispherical Emittance of Surfaces up to 1400&#176C

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ASTM C835-01(2006)

ASTM C835-01(2006)

Superseded Historical

Standard Test Method for Total Hemispherical Emittance of Surfaces up to 1400&#176C

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ASTM E673-01

ASTM E673-01

Superseded Historical

Standard Terminology Relating to Surface Analysis

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ASTM E673-98E1

ASTM E673-98E1

Superseded Historical

Standard Terminology Relating to Surface Analysis

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ASTM C835-00

ASTM C835-00

Superseded Historical

Standard Test Method for Total Hemispherical Emittance of Surfaces up to 1400&#176C

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DIN ISO/TS 16610-7:2001-11

DIN ISO/TS 16610-7:2001-11

Withdrawn Most Recent

Geometrical product specification (GPS) - Data extraction techniques by sampling and filtration - Part 7: Morphological scale space techniques (ISO/DTS 16610-7:2000)

€77.20

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DIN ISO/TS 16610-8:2001-11

DIN ISO/TS 16610-8:2001-11

Withdrawn Most Recent

Geometrical Product Specifications (GPS) - Data extraction techniques by sampling and filtration - Part 8: Robust spline filters (ISO/PDTR 16610-8:2001)

€56.17

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