Semiconductor devices. Non-destructive recognition criteria of defects in silicon carbide homoepitaxial wafer for power devices Test method using photoluminescence
€269.00
Semiconductor devices. Micro-electromechanical devices Bond strength test for glass frit bonded structures using micro-chevron-tests (MCT)
€183.00
Semiconductor devices. Micro-electromechanical devices Performance testing method of vibration-driven MEMS electret energy harvesting
Semiconductor devices. devices for energy harvesting and generation Vibration based piezoelectric
Semiconductor devices. Stress migration test standard Copper stress
Semiconductor devices. interface for human body communication Capsule endoscope
Connectors for electrical and electronic equipment Rectangular connectors. Detail specification 8-way, shielded, free fixed high density connectors data transmission with frequencies up to 100 MHz current carrying capacity 1 A
€316.00
BS IEC 62977-3-7. Electronic displays Part 3-7. Evaluation of optical performances. Tone characteristics
€23.00
Intelligent transport systems. Framework for cooperative telematics applications regulated commercial freight vehicles (TARV) Weigh-in-motion monitoring
€404.00
Electronic fee collection. Test procedures for user and fixed equipment Description of test
BS EN IEC 61966-2-4 AMD2. Multimedia systems and equipment. Colour measurement management Part 2-4. management. Extended-gamut YCC colour space for video applications. xvYCC (TA 2)
BS EN IEC 62906-5-5. Laser displays Part 5-5. Optical measuring methods of raster-scanning retina direct projection laser
Underwater acoustics. Hydrophones. Calibration of hydrophones Procedures for free-field calibration
BS EN 62246-4. Reed switches Part 4. Application in conjunction with magnetic-actuator used for Magnetic Sensing Protective Equipment (MSPE)
