Specification for harmonized system of quality assessment for electronic components. Family specification: digital integrated TTL-SCHOTTKY circuits, series 54S, 64S, 74S, 84S
€165.00
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: programmable logic arrays (PLA)
€193.00
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: integrated voltage regulators
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: integrated operational amplifiers
€269.00
Sound system equipment Methods for specifying and measuring the characteristics of loudspeakers
€316.00
Metal-clad base materials for printed wiring boards. Copper-clad Specification epoxide woven glass fabric copper-clad laminated sheet of defined flammability (vertical burning test)
Specification for polyolefin copper-conductor telecommunication cables
Rules for the preparation of detail specifications for semiconductor devices of assessed quality: transient suppressor diodes
Rules for the preparation of detail specifications for semiconductor devices of assessed quality: microwave semiconductor switches (without integrated driver circuits)
Rules for the preparation of detail specifications for semiconductor devices of assessed quality: p-i-n microwave passive limiter diodes
Specification for helical-scan video tape cassette system using 12.65 mm (0.5 in) magnetic tape on type L
Metal-clad base materials for printed wiring boards. Copper-clad Specification phenolic cellulose copper-clad laminated sheet of defined flammability (vertical burning test)
Base material for printed circuits. Specifications Flexible copper-clad polyimide film, general purpose grade
Metal-clad base materials for printed wiring boards. Special used in connection with circuits Specification prepreg use as a bonding sheet material the fabrication of multilayer board
€95.00
Specification for harmonized system of quality assessment for electronic components. Semiconductor discrete devices. Blank detail specification. Ambient-rated bipolar transistors for low and high-frequency amplification
