Semiconductor devices. Integrated circuits. Hybrid integrated circuits and film structures. Manufacturing line certification Manufacturers' self-audit checklist report
€404.00
Semiconductor devices. Integrated circuits. Hybrid integrated circuits and film structures. Manufacturing line certification Blank detail specification
€193.00
Semiconductor devices. Integrated circuits. Hybrid integrated circuits and film structures. Manufacturing line certification Generic specification
Connectors for electronic equipment. Tests and measurements. Current-carrying capacity tests Test 5b. Current-temperature derating
€165.00
Connectors for electronic equipment. Tests and measurements. Dynamic stress tests Test 6b. Bump
Connectors for electronic equipment. Tests and measurements. Climatic tests Test 11k. Low air pressure
Connectors for electronic equipment. Tests and measurements. Voltage stress tests Test 4c. proof of pre-insulated crimp barrels
Connectors for electronic equipment. Tests and measurements. Dynamic stress tests Test 6a. Acceleration, steady state
Connectors for electronic equipment. Tests and measurements. Dynamic stress tests Test 6c. Shock
Connectors for electronic equipment. Tests and measurements. Climatic tests Test 11d. Rapid change of temperature
Connectors for electronic equipment. Tests and measurements. Climatic tests Test 11m. Damp heat, cyclic
Connectors for electronic equipment. Tests and measurements. Voltage stress tests Test 4b. Partial discharge
Connectors for electronic equipment. Tests and measurements. Current-carrying capacity tests Test 5a. Temperature rise
Connectors for electronic equipment. Tests and measurements. Climatic tests Test 11e. Mould growth
Connectors for electronic equipment. Tests and measurements. Climatic tests Test 11j. Cold
