Integrated circuits. Measurement of electromagnetic emissions, 150 kHz to 1 GHz conducted emissions. Magnetic probe method
€355.00
Connectors for electronic equipment Detail specification 8-way, shielded, free and fixed connectors, data transmission with frequencies up to 1000 MHz
€193.00
Intelligent transport systems. Communications access for land mobiles (CALM). Management
€404.00
Semiconductor die products Procurement and use
Printed boards Device embedded substrate. Terminology / reliability design guide
€374.00
Connectors for electronic equipment. Tests and measurements Static load tests (fixed connectors). Test 8a. load, transverse
€165.00
Connectors for electronic equipment. Tests and measurements Cable clamping tests. Test 17a. clamp robustness
Connectors for electronic equipment. Tests and measurements Cable clamping tests. Test 17c. clamp resistance to cable pull (tensile)
Connectors for electronic equipment. Tests and measurements Cable clamping tests. Test 17d. clamp resistance to cable torsion
Semiconductor devices. Micro-electromechanical devices Generic specification for MEMS
€269.00
Connectors for electronic equipment Detail specification 8-way, shielded, free and fixed connectors data transmission with frequencies up to 600 MHz
Semiconductor devices. Mechanical and climatic test methods Die shear strength
Intelligent transport systems. Communications access for land mobiles (CALM). Data retention for law enforcement
Connectors for electronic equipment. Product requirements Rectangular connectors. Detail specification protective housings use with 8-way shielded and unshielded connectors frequencies up to 600 MHz industrial environments incorporating the IEC 60603-7 series interface. Variant 12 related 61076-3-106. Push-pull type
Mechanical standardization of semiconductor devices General rules for the preparation outline drawings surface mounted device packages. Design guide ball grid array (BGA)
