| Nombre | apoyo | Revisión | Disponibilidad | Fecha de emisión | Precio | ||
|---|---|---|---|---|---|---|---|
|
PDF |
Inglés |
Vigente |
1/7/2021 |
58,24 € |
|
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|
PDF |
Inglés |
Vigente |
1/9/2021 |
58,24 € |
|
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Detalles
This test is used to determine the terrestrial cosmic ray Soft Error Rate (SER) sensitivity of solid state volatile memory arrays and bistable logic elements (e.g., flip-flops) by measuring the error rate while the device is irradiated in a neutron or proton beam of known flux. The results of this accelerated test can be used to estimate the terrestrial cosmic ray induced SER for a given terrestrial cosmic ray radiation environment. This test cannot be used to project alpha-particle induced SER.
Información adicional
| Autor | JEDEC Solid State Technology Association |
|---|---|
| Publicado por | JEDEC |
| Tipo de Documento | Norma |
| Tema | /subgroups/36080 |
| ICS | 31.080.01 : Dispositivos semiconductores en general
|
| Número de páginas | 16 |
| Reemplaza | JEDEC JESD89-3A:2007 (R2012) |
| Palabra clave | JEDEC JESD89-1A |
