Nombre | apoyo | Revisión | Disponibilidad | Fecha de emisión | Precio | ||
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PDF |
Inglés |
Vigente |
1/11/2020 |
55,00 € |
|
Detalles
The Cycled Temperature-humidity-bias Life Test is performed for the purpose of evaluating the reliability of nonhermetic packaged solid state devices in humid environments. It employs conditions of temperature cycling, humidity, and bias that accelerate the penetration of moisture through the external protective material (encapsulant or seal) or along the interface between the external protective material and the metallic conductors that pass through it. The Cycled Temperature-Humidity-Bias Life Test is typically performed on cavity packages (e.g., MQUADs, lidded ceramic pin grid arrays, etc.) as an alternative to JESD22-A101 or JESD22-A110.
Información adicional
Autor | JEDEC Solid State Technology Association |
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Publicado por | JEDEC |
Tipo de Documento | Norma |
Tema | /subgroups/36080 |
Número de páginas | 10 |
Reemplaza | JEDEC JESD22-A100D,JEDEC JESD22-A100C |
Palabra clave | JEDEC JESD22-A100E |