JEDEC JEP118:2018

JEDEC JEP118:2018

GUIDELINES FOR GaAs MMIC AND FET LIFE TESTING

77,00 €

Detalles

These guidelines apply to GaAs Monolithic Microwave Integrated Circuits (MMICs) and their individual component building blocks, such as GaAs Metal-Semiconductor Field Effect Transistors (MESFETs), Pseudomorphic High Electron Mobility Transistors (PHEMTs), Heterojunction Bipolar Transistors (HBTs), resistors, and capacitors. While the procedure described in this document may be applied to other semiconductor technologies, especially those used in RF and microwave frequency analog applications, it is primarily intended for technologies based on GaAs and related III-V material systems (InP, AlGaAs, InGaAs, InGaP, GaN, etc).

Información adicional

Autor JEDEC Solid State Technology Association
Publicado por JEDEC
Tipo de Documento Norma
Tema /subgroups/36080
Número de páginas 28
Reemplaza JEDEC JEP118
Palabra clave JEDEC JEP118