Detalles
This document defines terms used in conjunction with, and the general principles of, test methods for determining the laser-induced damage threshold and for the assurance of optical laser components subjected to laser radiation.
Información adicional
| Autor | International Organization for Standardization (ISO) |
|---|---|
| Comité | ISO/TC 172/SC 9 |
| Publicado por | ISO |
| Tipo de Documento | Norma |
| Edición | 2 |
| ICS | 01.040.31 : Electrónica (Vocabularios)
31.260 : Optoelectrónica. Equipo láser |
| Número de páginas | 32 |
| Reemplaza | ISO 21254-1:2011 |
| Palabra clave | ISO 21254-1:2025 |
