IEC 63287-2:2023

IEC 63287-2:2023

IEC 63287-2:2023 Semiconductor devices - Guidelines for reliability qualification plans - Part 2: Concept of mission profile

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Detalles

IEC 63287-2:2023 gives guidelines for the development of reliability qualification plans using the concept of mission profile, based on the environmental conditioning and proposed usage of the product. This document is not intended for military- and space-related applications.

Información adicional

Autor International Electrotechnical Commission (IEC)
Comité TC 47
Publicado por IEC
Tipo de Documento Norma
Edición 1.0
ICS 31.080.01 : Dispositivos semiconductores en general
Número de páginas 30
Palabra clave IEC63287-2,IEC 63287-2:2023,IEC 63287-2,TC 47