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UNE-EN 15991:2015

UNE-EN 15991:2015

Testing of ceramic and basic materials - Direct determination of mass fractions of impurities in powders and granules of silicon carbide by inductively coupled plasma optical emission spectrometry (ICP OES) with electrothermal vaporisation (ETV) (Endorsed by AENOR in January of 2016.)

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Name Unterstützung Language Verfügbarkeit Datum der Ausstellung Preis
UNE-EN 15991:2015
PDF
Englisch
gültig
01.01.2016
69,00 €

Zusätzliche Information

Autor Asociacion Espanola de Normalizacion y Certificacion (AENOR)
Komitee CTN 61 - REFRACTORIES
Veröffentlicht von AENOR
Document type Normen
Datum der Bestätigung 2021-10-11
ICS 81.060.10 : Rohstoffe
Seitenzahl 27
Ersetzt UNE-EN 15991:2011
ändert UNE-EN ISO 1927-3:2012
Schlagwort UNE-EN 15991:2015

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