Name | Unterstützung | Language | Verfügbarkeit | Datum der Ausstellung | Preis | ||
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PDF |
Englisch |
gültig |
16.09.2019 |
40,00 € |
|
Details
Part 2 of this test method standard establishes uniform test methods for the mechanical testing to
determine resistance to deleterious effects of natural elements and conditions surrounding military operations. For the purpose of this standard, the term "devices" includes such items as monolithic, multichip, film and hybrid microcircuits, microcircuit arrays, and the elements from which the circuits and arrays are formed. This standard is intended to apply only to microelectronic devices.
Zusätzliche Information
Autor | U.S. Department of Defense (DoD) |
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Veröffentlicht von | DODNAV |
Document type | Normen |
ICS | 31.200 : Integrierten Schaltungen. Mikroelektronik
|
Seitenzahl | 385 |
Ersetzt | MIL-STD-883K:2018 |
angepasst von | Change 1 (change incorporated):12.01.2022 |