MIL-STD-750-1B:2022 + CN1:2023 & C2:2023

MIL-STD-750-1B:2022 + CN1:2023 & C2:2023

Environmental Test Methods for Semiconductor Devices Part 1: Test Methods 1000 Through 1999

55,00 €


Part 1 of this test method standard establishes uniform test methods for the basic environmental testing of semiconductor devices to determine resistance to deleterious effects of natural elements and conditions surrounding military operations. For the purpose of this test method standard, the term "devices" includes such items as transistors, diodes, voltage regulators, rectifiers, tunnel diodes, and other related parts. This part of a multipart test method standard is intended to apply only to semiconductor devices.

Zusätzliche Information

Autor U.S. Department of Defense (DoD)
Veröffentlicht von DODNAV
Document type Normen
Ausgabe B
ICS 31.080.01 : Halbleitervorrichtungen allgemein
Seitenzahl 531
Ersetzt MIL-STD-750-1A:2015 + C1:2016, C2:2016, C3:2019 & C4:2021
angepasst von Change Notice 1:31.01.2023, Change 2 (all previous changes incorporated):18.04.2023