Details
IEC 63616:2025 relates to a conductivity measurement method of thin metal films at microwave and millimeter-wave frequencies. This method has been developed to evaluate the conductivity of a metal foil used for adhering to a substrate or the interfacial conductivity of a metal layer formed on a dielectric substrate. It uses higher-order modes of a balanced-type circular disk resonator and provides broadband conductivity measurements by using a single resonator.
Zusätzliche Information
| Autor | International Electrotechnical Commission (IEC) |
|---|---|
| Komitee | TC 46/SC 46F |
| Veröffentlicht von | IEC |
| Document type | Normen |
| Ausgabe | 1.0 |
| ICS | 17.220.20 : Messung elektrischer und magnetischer Größen
29.050 : Supraleitung und leitenden Materialien |
| Seitenzahl | 26 |
| Schlagwort | IEC63616,IEC 63616:2025,IEC 63616 |
