ESD TR5.4-02-08:2008

ESD TR5.4-02-08:2008

Determination of CMOS Latch-up Susceptibility, Transient Induced Latch-Up - Technical Report No. 2

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Details

This technical report is intended to provide background information pertaining to the development of the transient latch-up standard practice.

Zusätzliche Information

Autor EOS/ESD Association, Inc.
Veröffentlicht von ESD
Document type Normen
Seitenzahl 62
Schlagwort ESD TR5.4-02-08