| Name | Unterstützung | Language | Verfügbarkeit | Datum der Ausstellung | Preis | ||
|---|---|---|---|---|---|---|---|
|
PDF |
Englisch |
gültig |
10.12.2025 |
244,00 € |
|
||
Details
IEC TS 62607-6-26:2025, which is a Technical Specification, establishes a standardized method to determine the mechanical key control characteristics (KCCs)
• Young's modulus (or elastic modulus),
• residual strain,
• residual stress, and
• fracture stress
of 2D materials and nanoscale films using the
• bulge test.
The bulge test is a reliable method where a pressure differential is applied to a freestanding film, and the resulting deformation is measured to derive the mechanical properties.
• This method is applicable to a wide range of freestanding 2D materials, such as graphene, and nanometre-thick films with thicknesses typically ranging from 1 nm to several hundred nanometres.
• This document ensures the characterization of mechanical properties essential for assessing the structural integrity and performance of materials in applications such as composite additives, flexible electronics, and energy harvesting devices.
Zusätzliche Information
| Autor | International Electrotechnical Commission (IEC) |
|---|---|
| Komitee | TC 113 |
| Veröffentlicht von | IEC |
| Document type | Normen |
| Ausgabe | 1.0 |
| ICS | 07.120 : Nanotechnologie
|
| Seitenzahl | 26 |
| Schlagwort | IEC62607-6-26,IEC TS 62607-6-26:2025,IEC/TS 62607-6-26 |
