| Nom | Support | Langue | Disponibilité | Date d'édition | Prix | ||
|---|---|---|---|---|---|---|---|
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PDF |
Allemand |
Active |
01/01/2022 |
110,75 € |
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Détails
This standard defines characteristics and measurement methods to specify terahertz systems for time domain spectroscopy (TDS). This allows manufacturers to describe their systems in a consistent manner and users to easily compare systems. Systems for terahertz time domain spectroscopy are active systems and use different techniques for both the generation and time-resolved measurement of broadband terahertz pulses. The corresponding terahertz spectra and phases are calculated after a temporal sampling using a Fourier transformation. This standard provides an overview of the functions of time domain spectrometers, explains the measurement methods used in detail, and defines the required terms and characteristics. This standard focuses on systems based on so-called sampling measurement methods.
Informations supplémentaires
| Auteur | Verein Deutscher Ingenieure (VDI) |
|---|---|
| Edité par | VDI |
| Type de document | Norme |
| ICS | 17.180.30 : Instruments optiques de mesure
|
| Nombre de pages | 27 |
| Remplace | VDI/VDE 5590 Blatt 2 (2020-10) |
| Mot-clé | VDI 5590,VDI 5590 Blatt 2,VDI/VDE 5590,5590 |
