| Nom | Support | Langue | Disponibilité | Date d'édition | Prix | ||
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PDF |
Anglais |
Active |
07/07/2021 |
119,00 € |
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Détails
This document is an annex to SAE Technical Report SSB-1 (the latest revision).
This document provides reference information and guidance concerning methods used by the semiconductor industry and original equipment manufacturers related to radiation hardness assessments. This document is broken into three primary sections. Section 3 discusses part characterization with focus on selection criteria and acceptance testing. Section 4 discusses design hardening for piece parts with focus on degraded design limits and radiation design margin. The last section, Section 5, of this report is on hardness assurance inspection and test. This section discusses total ionizing dose, displacement damage and single event effects testing in detail.
Informations supplémentaires
| Auteur | Society of Automotive Engineers International (SAE) |
|---|---|
| Comité | CE-12 Solid State Devices |
| Edité par | SAE |
| Type de document | Norme |
| Nombre de pages | 26 |
| Mot-clé | SAE 1005,SAE SSB1_005,SAE SSB1_005,SAE SSB 1_005 |
