AEC
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AEC Q102 Rev A:2020
Failure mechanism based stress test qualification for optoelectronic semiconductors in automotive applications
06/04/2020 - PDF sécurisé - Anglais - AEC
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25,00 €
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AEC Q100-011 Rev D:2019
Failure Mechanism Based Stress Test Qualification for Integrated Circuits - Attachment 11: Charged Device Model (CDM) Electrostatic Discharge Test
29/01/2019 - PDF - Anglais - AEC
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AEC Q104:2017
Failure mechanism based stress test qualification for multichip modules (MCM) in automotive applications
14/09/2017 - PDF sécurisé - Anglais - AEC
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AEC Charter Rev G:2017
Automotive Electronics Council - Component Technical Committee Charter
30/06/2017 - PDF - Anglais - AEC
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AEC Q006 REV A:2016
Qualification requirements for components using copper (Cu) wire interconnections
01/07/2016 - PDF sécurisé - Anglais - AEC
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AEC QTP:2014
Failure Mechanism Based Stress Test Qualification for Integrated Circuits, Q100 Qualification Test Plan
11/12/2014 - PDF sécurisé - Anglais - AEC
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AEC CDC:2014
Failure Mechanism Based Stress Test Qualification for Integrated Circuits, Appendix 2 - Q100 Certification of Design, Construction and Qualification
11/09/2014 - Fichier word - Anglais - AEC
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AEC Q100 Rev H:2014
Failure Mechanism Based Stress Test Qualification for Integrated Circuits
11/09/2014 - PDF sécurisé - Anglais - AEC
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AEC Q101 Rev D1:2013
Failure Mechanism based Stress Test Qualification for Discrete Semiconductors in Automotive Applications
06/09/2013 - PDF sécurisé - Anglais - AEC
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AEC Q100-002 Rev E:2013
Failure Mechanism Based Stress Test Qualification for Integrated Circuits, Attachment 2 - Human Body Model Electrostatic Discharge Test
20/08/2013 - PDF sécurisé - Anglais - AEC
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AEC Q003 Rev A:2013
Guideline for Characterization of Integrated Circuits
18/02/2013 - PDF sécurisé - Anglais - AEC
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AEC Q100-004 Rev D:2012
Failure Mechanism Based Stress Test Qualification for Integrated Circuits - Attachment 4: IC Latch-Up Test
07/08/2012 - PDF sécurisé - Anglais - AEC
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AEC Q100-005 Rev D1:2012
Stress Test Qualification for Integrated Circuits, Attachment 5 - Non-Volatile Memory Program/Erase Endurance, Data Retention, and Operational Life Test
09/01/2012 - PDF sécurisé - Anglais - AEC
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25,00 €
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AEC Q200-001 Rev B:2010
Stress test qualification for passive components - Attachment 1: Flame retardance test
01/06/2010 - PDF sécurisé - Anglais - AEC
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AEC Q200-002 Rev B:2010
Stress test qualification for passive components - Attachment 2: Human body model electrostatic discharge test
01/06/2010 - PDF sécurisé - Anglais - AEC
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AEC Q200-003 Rev B:2010
Stress test qualification for passive components - Attachment 3: Beam load (break strength) test
01/06/2010 - PDF sécurisé - Anglais - AEC
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AEC Q200-005 Rev A:2010
Stress test qualification for passive components - Attachment 5: Board flex test
01/06/2010 - PDF sécurisé - Anglais - AEC
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AEC Q200-006 Rev A:2010
Stress test qualification for passive components - Attachment 6: Terminal strength (SMD) / Shear stress test
01/06/2010 - PDF sécurisé - Anglais - AEC
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AEC Q200-007 Rev A:2010
Stress test qualification for passive components - Attachment 7: Voltage surge test
01/06/2010 - PDF sécurisé - Anglais - AEC
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AEC Q200 Rev D:2010
Stress test qualification for passive components
01/06/2010 - PDF sécurisé - Anglais - AEC
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25,00 €
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AEC Q100-007 Rev B:2007
Failure Mechanism Based Stress Test Qualification for Integrated Circuits, Attachment 7 - Fault Simulation and Fault Grading
18/09/2007 - PDF sécurisé - Anglais - AEC
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AEC Q100-009 Rev B:2007
Failure Mechanism Based Stress Test Qualification for Integrated Circuits, Attachment 9 - Electrical Distributions Assessment
27/08/2007 - PDF sécurisé - Anglais - AEC
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AEC Q100-012:2006
Failure Mechanism Based Stress Test Qualification for Integrated Circuits, Attachment 12 - Short Circuit Reliability Characterization of Smart Power Devices for 12V Systems
14/09/2006 - PDF sécurisé - Anglais - AEC
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AEC Q101-006:2006
Stress Test Qualification for Automotive Grade Discrete Semiconductors, Attachment 6 - Short Circuit Reliability Characterization of Smart Power Devices for 12V Systems
14/09/2006 - PDF sécurisé - Anglais - AEC
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AEC Q101-001 Rev A:2005
Stress Test Qualification for Automotive Grade Discrete Semiconductors, Attachment 1 - Human Body Model (HBM) Electrostatic Discharge (ESD) Test
18/07/2005 - PDF sécurisé - Anglais - AEC
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AEC Q101-003 Rev A:2005
Stress Test Qualification for Automotive Grade Discrete Semiconductors, Attachment 3 - Wire Bond Shear Test
18/07/2005 - PDF sécurisé - Anglais - AEC
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AEC Q101-005:2005
Stress Test Qualification for Automotive Grade Discrete Semiconductors, Attachment 5 - Capacitive Discharge Model (CDM) Electrostatic Discharge (ESD) Test
18/07/2005 - PDF sécurisé - Anglais - AEC
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AEC Q100-010 Rev A:2003
Failure Mechanism Based Stress Test Qualification for Integrated Circuits, Attachment 10 - Solder Ball Shear Test
18/07/2003 - PDF sécurisé - Anglais - AEC
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AEC Q100-008 Rev A:2003
Failure Mechanism Based Stress Test Qualification for Integrated Circuits, Attachment 8 - Early Life Failure Rate (ELFR)
18/07/2003 - PDF sécurisé - Anglais - AEC
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AEC Q200-004 Rev A:2000
Stress test qualification for passive components - Attachment 4: Measurement procedures for resettable fuses
01/06/2000 - PDF sécurisé - Anglais - AEC
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AEC Q100-001 Rev C:1998
Failure Mechanism Based Stress Test Qualification for Integrated Circuits, Attachment 1 - Wire Bond Shear Test
08/10/1998 - PDF sécurisé - Anglais - AEC
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AEC Q101-004:1996
Stress Test Qualification for Automotive Grade Discrete Semiconductors, Attachment 4 - Miscellaneous Test Methods
15/05/1996 - PDF sécurisé - Anglais - AEC
En savoir plus25,00 €
