| Nom | Support | Langue | Disponibilité | Date d'édition | Prix | ||
|---|---|---|---|---|---|---|---|
|
PDF |
Anglais |
Active |
16/09/2019 |
40,00 € |
|
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Détails
Part 1 of this test method standard establishes uniform test methods for the basic environmental
testing of microelectronic devices to determine resistance to deleterious effects of natural elements and conditions surrounding military operations. For the purpose of this standard, the term "devices" includes such items as monolithic, multichip, film and hybrid microcircuits, microcircuit arrays, and the elements from which the circuits and arrays are formed. This standard is intended to apply only to microelectronic devices.
Informations supplémentaires
| Auteur | U.S. Department of Defense (DoD) |
|---|---|
| Edité par | DODNAV |
| Type de document | Norme |
| ICS | 31.200 : Circuits intégrés. micro-électronique
|
| Nombre de pages | 216 |
| Remplace | MIL-STD-883K:2018 |
| Modifié par | Change 1 (change incorporated):24.09.2021 |
