| Nom | Support | Langue | Disponibilité | Date d'édition | Prix | ||
|---|---|---|---|---|---|---|---|
|
PDF |
Anglais |
Active |
01/07/2021 |
58,24 € |
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|
PDF |
Anglais |
Active |
01/09/2021 |
58,24 € |
|
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Détails
This test is used to determine the terrestrial cosmic ray Soft Error Rate (SER) sensitivity of solid state volatile memory arrays and bistable logic elements (e.g., flip-flops) by measuring the error rate while the device is irradiated in a neutron or proton beam of known flux. The results of this accelerated test can be used to estimate the terrestrial cosmic ray induced SER for a given terrestrial cosmic ray radiation environment. This test cannot be used to project alpha-particle induced SER.
Informations supplémentaires
| Auteur | JEDEC Solid State Technology Association |
|---|---|
| Edité par | JEDEC |
| Type de document | Norme |
| Thème | /subgroups/36080 |
| ICS | 31.080.01 : Dispositifs à semi-conducteurs en général
|
| Nombre de pages | 16 |
| Remplace | JEDEC JESD89-3A:2007 (R2012) |
| Mot-clé | JEDEC JESD89-1A |
