JEDEC JESD234:2013

JEDEC JESD234:2013

Test Standard for the Measurement of Proton Radiation Single Event Effects in Electronic Devices

83,00 €

Détails

This test standard defines the requirements and procedures for 40 to 500 MeV proton irradiation of electronic devices for Single Event Effects (SEE), and reporting the results. Protons are capable of causing SEE by both direct and indirect ionization, however, in this energy range, indirect ionization will be the dominant cause of SEE [1-3]. Indirect ionization is produced from secondary particles of proton/material nuclear reactions, where the material is Si or any other element present in the semiconductor. Direct proton ionization is thought to be a minor source of SEE, at these energies. This energy range is also selected to coincide with the commonly used proton facilities, and result in the fewest energy dependent issues during test.

Informations supplémentaires

Auteur JEDEC Solid State Technology Association
Edité par JEDEC
Type de document Norme
Thème /subgroups/37160
Nombre de pages 40
Mot-clé JEDEC JESD234