JEDEC JESD226:2013

JEDEC JESD226:2013

RF Biased Life (RFBL) Test Method

64,00 €

Détails

This stress method is used to determine the effects of RF bias conditions and temperature on Power
Amplifier Modules (PAMs) over time. These conditions are intended to simulate the devices? operating
condition in an accelerated way, and they are expected to be applied primarily for device qualification and
reliability monitoring.

Informations supplémentaires

Auteur JEDEC Solid State Technology Association
Edité par JEDEC
Type de document Norme
Thème /subgroups/36943
Nombre de pages 20
Mot-clé JEDEC JESD226