JEDEC JEP174:2016

JEDEC JEP174:2016

UNDERSTANDING ELECTRICAL OVERSTRESS - EOS

223,00 €

Détails

The purpose of this white paper will be to introduce a new perspective about EOS to the electronics industry. As failures exhibiting EOS damage are commonly experienced in the industry, and these severe overstress events are a factor in the damage of many products, the intent of the white paper is to clarify what EOS really is and how it can be mitigated once it is properly comprehended.

Informations supplémentaires

Auteur JEDEC Solid State Technology Association
Edité par JEDEC
Type de document Norme
Thème /subgroups/36943
Nombre de pages 174
Mot-clé JEDEC JEP174