IEEE 2665:2022

IEEE 2665:2022

IEEE Recommended Practice for Statistical Process Control for EMC Test Laboratories

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New IEEE Standard - Active.
Guidance is provided on how to verify electromagnetic compatibility (EMC) test performance through the use of statistical process control (SPC) and examples of setups. Employing SPC, the validity of tests can be monitored by a laboratory by recording data in such a way that trends are detectable, and an assessment of test system stability can be made. Laboratory quality checks that use SPC are a powerful tool to provide confidence, to both the laboratory and its customer, that test results will be correct.

This recommended practice provides guidance on how to verify electromagnetic compatibility (EMC) test performance using statistical process control (SPC) and specialized setups. EMC test laboratories that need to comply with the requirements of ISO/IEC 17025 should find this information especially relevant as they develop the required procedure(s) for monitoring the validity of results. By employing SPC, a laboratory may monitor the validity of tests by recording data in such a way that trends are detectible, and an assessment of test system stability can be made. Laboratory quality checks that use SPC are a powerful tool to provide confidence to both the laboratory and its customer that test results will be correct.
The purpose of this document is to provide a recommended practice for implementing SPC for EMC laboratories. The standard will review the relevant SPC calculations, discuss how to set control limits for analyzing data, present recommendations for setting up SPC in a laboratory environment, and propose examples of SPC setups for the following test methods:--Radiated emissions--Conducted RF emissions--Conducted transient emissions--Radiated immunity--Bulk current injection--Magnetic immunity--Conducted transient immunity--Electrostatic discharge The intent of this standard is to present a recommended practice for SPC that is broad enough to apply across multiple industries. Consequently, the information contained in this document will introduce the fundamental SPC setup elements for each test method. Laboratories can then apply this information to their specific application(s)

Informations supplémentaires

Auteur Institute of Electrical and Electronics Engineers (IEEE)
Comité Standards Development Committee
Edité par IEEE
Type de document Norme
Edition révision n° 0
EAN ISBN 978-1-5044-9369-7
ICS 33.100.20 : Immunité
Nombre de pages 42
Mot-clé IEEE 2665-2022
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