IEC TS 63342:2022

IEC TS 63342:2022

IEC TS 63342:2022 C-Si photovoltaic (PV) modules - Light and elevated temperature induced degradation (LETID) test - Detection

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Détails

IEC TS 63342:2022 is designed to assess the effect of light induced degradation at elevated temperatures (LETID) by application of electrical current at higher temperatures. In this document, only the current injection approach for the detection of LETID is addressed.
This document does not address the B-O and Iron Boron (Fe-B) related degradation phenomena, which already occur at room temperatures under the presence of light and on much faster time scales. The proposed test procedure can reveal sample sensitivity to LETID degradation mechanisms, but it does not provide an exact measure of field observable degradation.

Informations supplémentaires

Auteur International Electrotechnical Commission (IEC)
Comité TC 82
Edité par IEC
Type de document Norme
Edition révision n° 1
ICS 27.160 : énergie solaire
Nombre de pages 13
Mot-clé IEC63342,IEC TS 63342:2022,IEC/TS 63342,TC 82