| Nom | Support | Langue | Disponibilité | Date d'édition | Prix | ||
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PDF |
Anglais |
Active |
19/08/2022 |
270,00 € |
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Détails
IEC TS 62788-6-3:2022 describes the single cantilevered beam (SCB) test, useful for characterizing adhesion in photovoltaic (PV) modules. This document offers a generalized method for performing the test, with the expectation that best practices for utilizing this test method will be developed for specific applications.
This document provides a method for measuring the adhesion energy of most interfaces within the photovoltaic (PV) module laminate. This method provides a measure of adhesive energy, via the critical energy release rate, and so is more useful for comparing adhesion of different specimen types, e.g. different materials, module or coupon samples, or materials before and after stress exposure.
Informations supplémentaires
| Auteur | International Electrotechnical Commission (IEC) |
|---|---|
| Comité | TC 82 |
| Edité par | IEC |
| Type de document | Norme |
| Edition révision n° | 1 |
| ICS | 27.160 : énergie solaire
|
| Nombre de pages | 32 |
| Mot-clé | IEC62788-6-3,IEC TS 62788-6-3:2022,IEC/TS 62788-6-3,TC 82 |
