IEC TS 62622:2012

IEC TS 62622:2012

IEC TS 62622:2012 Nanotechnologies - Description, measurement and dimensional quality parameters of artificial gratings

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Détails

IEC/TS 62622:2012(E), which is a technical specification, specifies the generic terminology for the global and local quality parameters of artificial gratings, interpreted in terms of deviations from nominal positions of grating features, and provides guidance on the categorization of measurement and evaluation methods for their determination. This specification is intended to facilitate communication among manufacturers, users and calibration laboratories dealing with the characterization of the dimensional quality parameters of artificial gratings used in nanotechnology. This specification supports quality assurance in the production and use of artificial gratings in different areas of application in nanotechnology. Whilst the definitions and described methods are universal to a large variety of different gratings, the focus is on one-dimensional (1D) and two-dimensional (2D) gratings.

Informations supplémentaires

Auteur International Electrotechnical Commission (IEC)
Comité TC 113
Edité par IEC
Type de document Norme
Edition révision n° 1
ICS 07.030 : Physique. chimie
07.120 : Nanotechnologie
Nombre de pages 40
Mot-clé IEC62622,IEC TS 62622:2012,IEC/TS 62622,TC 113