| Nom | Support | Langue | Disponibilité | Date d'édition | Prix | ||
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PDF |
Anglais |
Active |
03/05/2023 |
173,00 € |
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Détails
IEC TS 62607-6-17:2023 establishes a standardized method to determine the key control characteristic order parameter for graphene-based material and layered carbon material by X-ray diffraction (XRD) and transmission electron microscopy.
The order parameter is analysed from two perspectives: z-axis and x-y-axis. In the z-axis the order parameter is derived from the full width at half maximum (FWHM) of peak (002) in the XRD spectrum. In the x-y-axis, it is derived from the FWHM of peak (100) corresponding to diffraction patterns obtained by SAED (selected area electron diffraction) technique, which is routinely performed on most transmission electron microscopes in the world.
The method is applicable for graphene-based material and layered carbon material including graphite, expanded graphite, amorphous carbon, vitreous carbon or glassy carbon, the structures of which are clarified by other characterization techniques.
The method is applicable for differentiating few-layer graphene or reduced graphene oxide from layered carbon material.
Typical application area is quality control in manufacturing to ensure batch-to-batch reproducibility.
NOTE Graphene oxide, one type of graphene-based material, is not within the scope of this document.
Informations supplémentaires
| Auteur | International Electrotechnical Commission (IEC) |
|---|---|
| Comité | TC 113 |
| Edité par | IEC |
| Type de document | Norme |
| Edition révision n° | 1 |
| ICS | 07.120 : Nanotechnologie
|
| Nombre de pages | 24 |
| Mot-clé | IEC62607-6-17,IEC TS 62607-6-17:2023,IEC/TS 62607-6-17,TC 113 |
