| Nom | Support | Langue | Disponibilité | Date d'édition | Prix | ||
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PDF |
Anglais |
Active |
14/04/2020 |
132,00 € |
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Détails
IEC TS 62607-5-3:2020 specifies sample structures for evaluating a wide range of charge carrier concentration in organic/nano materials. This specification is provided for both capacitance-voltage (C-V) measurements in metal/insulator/semiconductor stacking structures and Hall-effect measurements with the van der Pauw configuration. Criteria for choosing measurement methods of charge carrier concentration in organic semiconductor layers are also given in this document.
Informations supplémentaires
| Auteur | International Electrotechnical Commission (IEC) |
|---|---|
| Comité | TC 113 |
| Edité par | IEC |
| Type de document | Norme |
| Edition révision n° | 1 |
| ICS | 07.030 : Physique. chimie
07.120 : Nanotechnologie |
| Nombre de pages | 20 |
| Mot-clé | IEC62607-5-3,IEC TS 62607-5-3:2020,IEC/TS 62607-5-3,TC 113 |
