| Nom | Support | Langue | Disponibilité | Date d'édition | Prix | ||
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PDF |
Anglais |
Active |
01/01/2019 |
186,76 € |
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Détails
This standard establishes the procedure for testing, evaluating, and classifying devices and microcircuits according to their susceptibility (sensitivity) to damage or degradation by exposure to a defined charged device model (CDM) electrostatic discharge (ESD). All packaged semiconductor devices, thin film circuits, surface acoustic wave (SAW) devices, opto-electronic devices, hybrid integrated circuits (HICs), and multi-chip modules (MCMs) containing any of these devices are to be evaluated according to this standard. To perform the tests, the devices must be assembled into a package similar to that expected in the final application.
Informations supplémentaires
| Auteur | JEDEC Solid State Technology Association (JEDEC) |
|---|---|
| Edité par | JEDEC |
| Type de document | Norme |
| ICS | 31.080.01 : Dispositifs à semi-conducteurs en général
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| Nombre de pages | 40 |
| Remplace | ANSI/ESDA/JEDEC JS-002:2014 |
| ANSI Approved |
