| Nom | Support | Langue | Disponibilité | Date d'édition | Prix | ||
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PDF sécurisé |
Anglais |
Active |
26/07/2022 |
181,00 € |
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Détails
This document establishes the procedure for testing, evaluating, and classifying devices and microcircuits according to their susceptibility (sensitivity) to damage or degradation by exposure to a defined field-induced charged device model (CDM) electrostatic discharge (ESD). All packaged semiconductor devices, thin-film circuits, surface acoustic wave (SAW) devices, optoelectronic devices, hybrid integrated circuits (HICs), and multi-chip modules (MCMs) containing any of these devices are to be evaluated according to this standard. The devices shall be assembled into a package similar to that expected in the final application to perform the tests. This CDM document does not apply to socketed discharge model testers.
Informations supplémentaires
| Auteur | EOS/ESD Association, Inc. |
|---|---|
| Edité par | ESD |
| Type de document | Norme |
| Thème | /subgroups/36080 |
| EAN ISBN | 1585373338 |
| Nombre de pages | 52 |
| Remplace | ESD JS-002-2018,JEDEC JS-002-2014,JEDEC JESD22-C101F,JEDEC JESD22-C101E |
| Mot-clé | ESD JS-002-2022 |
