UNE-EN 62373:2006

UNE-EN 62373:2006

Bias-temperature stability test for metal-oxide, semiconductor, field-effect transistors (MOSFET) (IEC 62373:2006). (Endorsed by AENOR in November of 2006.)

€60.00
Alert me in case of modifications on this product

Additional Info

Author Asociacion Espanola de Normalizacion y Certificacion (AENOR)
Committee CTN 209/SC 47 - SEMICONDUCTOR DEVICES
Published by AENOR
Document type Standard
ICS 31.080.30 : Transistors
Number of pages 17
Keyword UNE-EN 62373:2006