UNE-EN 61189-5-503:2017

UNE-EN 61189-5-503:2017

Test methods for electrical materials, printed board and other interconnection structures and assemblies - Part 5-503: General test method for materials and assemblies - Conductive anodic filaments (CAF) testing of circuit boards (Endorsed by Asociación Española de Normalización in September of 2017.)

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Additional Info

Author Asociacion Espanola de Normalizacion y Certificacion (AENOR)
Committee CTN 203/SC 91-119 - ELECTRONICS ASSEMBLY TECHNOLOGY AND PRINTED ELECTRONICS
Published by AENOR
Document type Standard
ICS 31.180 : Printed circuits and boards
Number of pages 33
Keyword UNE-EN 61189-5-503:2017