JEDEC
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€113.00 -
JEDEC JESD251-1:2018
Addendum No. 1 to JESD251, Optional x4 Quad I/O With Data Strobe
10/1/2018 - PDF - English - JEDEC
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€124.00
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JEDEC JESD79-3-1A:2013
Addendum No. 1 to JESD79-3 - 1.35 V DDR3L-800, DDR3L-1066, DDR3L-1333, and DDR3L-1600
1/1/2013 - PDF - English - JEDEC
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JEDEC JESD79-3-2:2011
Addendum No. 2 to JESD79-3 - 1.35 V DDR3L-800, DDR3L-1066, DDR3L-1333, and DDR3L-1600
10/1/2011 - PDF - English - JEDEC
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JEDEC JESD79-3-1:2010
Addendum No. 1 to JESD79-3 - 1.35 V DDR3L-800, DDR3L-1066, DDR3L-1333, and DDR3L-1600
7/1/2010 - PDF - English - JEDEC
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JEDEC JESD96A-1:2007
Addendum 1 to JESD96A - INTEROPERABILITY AND COMPLIANCE TECHNICAL REQUIREMENTS FOR JEDEC STANDARD JESD96A - RECOMMENDED PRACTICE FOR USE WITH IEEE 802.11N
1/1/2007 - PDF - English - JEDEC
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JEDEC JESD24-12:2004
THERMAL IMPEDANCE MEASUREMENT FOR INSULATED GATE BIPOLAR TRANSISTORS - (Delta VCE(on) Method)
6/1/2004 - PDF - English - JEDEC
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JEDEC JESD 24-6(R2002):2001
ADDENDUM No. 6 to JESD24 - THERMAL IMPEDANCE MEASUREMENTS FOR INSULATED GATE BIPOLAR TRANSISTORS
10/1/2001 - PDF - English - JEDEC
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JEDEC JESD 24-11(R2002):1996
ADDENDUM No. 11 to JESD24 - POWER MOSFET EQUIVALENT SERIES GATE RESISTANCE TEST METHOD
8/1/1996 - PDF - English - JEDEC
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JEDEC JESD 24-10(R2002):1994
ADDENDUM No. 10 to JESD24 - TEST METHOD FOR MEASUREMENT OF REVERSE RECOVERY TIME trr FOR POWER MOSFET DRAIN-SOURCE DIODES
8/1/1994 - PDF - English - JEDEC
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JEDEC JESD 12-1B:1993
ADDENDUM No. 1 to JESD12 - TERMS AND DEFINITIONS FOR GATE ARRAYS AND CELL-BASED INTEGRATED CIRCUITS
8/1/1993 - PDF - English - JEDEC
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JEDEC JESD 24-9(R2002):1992
ADDENDUM No. 9 to JESD24 - SHORT CIRCUIT WITHSTAND TIME TEST METHOD
8/1/1992 - PDF - English - JEDEC
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JEDEC JESD 24-8(R2002):1992
ADDENDUM No. 8 to JESD24 - METHOD FOR REPETITIVE INDUCTIVE LOAD AVALANCHE SWITCHING
8/1/1992 - PDF - English - JEDEC
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JEDEC JESD 12-6:1991
ADDENDUM No. 6 to JESD12 - INTERFACE STANDARD FOR SEMICUSTOM INTEGRATED CIRCUITS
3/1/1991 - PDF - English - JEDEC
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€57.00
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JEDEC JESD 24-4(R2002):1990
ADDENDUM No. 4 to JESD24 - THERMAL IMPEDANCE MEASUREMENTS FOR BIPOLAR TRANSISTORS (DELTA BASE-EMITTER VOLTAGE METHOD)
11/1/1990 - PDF - English - JEDEC
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JEDEC JESD 24-3:1990
ADDENDUM No. 3 to JESD24 - THERMAL IMPEDANCE MEASUREMENTS FOR VERTICAL POWER MOSFETS (DELTA SOURCE-DRAIN VOLTAGE METHOD)
11/1/1990 - PDF - English - JEDEC
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JEDEC JESD 24-5(R2002):1990
ADDENDUM No. 5 to JESD24 - SINGLE PULSE UNCLAMPED INDUCTIVE SWITCHING (UIS) AVALANCHE TEST METHOD
8/1/1990 - PDF - English - JEDEC
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JEDEC JESD 24-1(R2002):1989
ADDENDUM No. 1 to JESD24 - METHOD FOR MEASUREMENT OF POWER DEVICE TURN-OFF SWITCHING LOSS
10/1/1989 - PDF - English - JEDEC
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JEDEC JESD 12-5:1988
ADDENDUM No. 5 to JESD12 - DESIGN FOR TESTABILITY GUIDELINES
8/1/1988 - PDF - English - JEDEC
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JEDEC JESD 12-4:1987
ADDENDUM No. 4 to JESD12 - METHOD OF SPECIFICATION OF PERFORMANCE PARAMETERS FOR CMOS SEMICUSTOM INTEGRATED CIRCUITS
4/1/1987 - PDF - English - JEDEC
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JEDEC JESD 12-3:1986
ADDENDUM No. 3 to JESD12 - CMOS GATE ARRAY MACROCELL STANDARD
6/1/1986 - PDF - English - JEDEC
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JEDEC JESD 12-2:1986
ADDENDUM No. 2 to JESD12 - STANDARD FOR CELL-BASED INTEGRATED CIRCUIT BENCHMARK SET
2/1/1986 - PDF - English - JEDEC
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JEDEC JESD 24-7(R2002):1982
ADDENDUM No. 7 to JESD24 - COMMUTATING DIODE SAFE OPERATING AREA TEST PROCEDURE FOR MEASURING dv/dt DURING REVERSE RECOVERY OF POWER TRANSISTORS
8/1/1982 - PDF - English - JEDEC
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€113.00
