JEDEC
-
€60.48 -
€60.48
-
JEDEC JESD22-A100E:2020
Cycled Temperature Humidity-Bias with Surface Condensation Life Test
11/1/2020 - PDF - English - JEDEC
Learn More€52.28 -
JEDEC JESD22-A113I:2020
Preconditioning of Nonhermetic Surface Mount Devices Prior to Reliability Testing
4/1/2020 - PDF - English - JEDEC
Learn More€79.95 -
€54.33
-
€54.33
-
€54.33
-
€378.23
-
€57.40
-
€335.18
-
JEDEC JESD220-3:2020
Universal Flash Storage (UFS) Host Performance Booster (HPB) Extension
1/1/2020 - PDF - English - JEDEC
Learn More€77.90 -
€363.88
-
JEDEC JEP162A:2019
System Level ESD Part II: Implementation of Effective ESD Robust Designs
9/1/2019 - PDF - English - JEDEC
Learn More€195.78 -
€233.70
-
€118.90
-
€55.35
-
€68.68
-
€68.68
-
€61.50
-
€195.78
-
ESDA/JEDEC JS-002:2018
ESDA/JEDEC Joint Standard for Electrostatic Discharge Sensitivity Testing - Charged Device Model (CDM) - Device Level
1/1/2019 - PDF - English - JEDEC
Learn More€186.76 -
EIA JESD 84-B51:2019
Embedded Multi-Media Card (e MMC) Electrical Standard (5.1)
1/1/2019 - PDF sécurisé - English - JEDEC
Learn More€300.84 -
JEDEC JEP 143D:2019
Solid-State Reliability Assessment and Qualification Methodologies
1/1/2019 - PDF sécurisé - English - JEDEC
Learn More€85.80 -
JEDEC JESD84-B51:2019
Embedded Multi-media card (e*MMC), Electrical Standard (5.1)
1/1/2019 - PDF - English - JEDEC
Learn More€335.18 -
€73.80
-
JEDEC JESD22-A117E:2018
ELECTRICALLY ERASABLE PROGRAMMABLE ROM (EEPROM) PROGRAM/ERASE ENDURANCE AND DATA RETENTION TEST
11/1/2018 - PDF - English - JEDEC
Learn More€68.68 -
€233.70
-
€213.20
-
€54.33
-
€54.33
-
JEDEC JESD251-1:2018
Addendum No. 1 to JESD251, Optional x4 Quad I/O With Data Strobe
10/1/2018 - PDF - English - JEDEC
Learn More€63.55 -
JEDEC JEP001-3A:2018
FOUNDRY PROCESS QUALIFICATION GUIDELINES - PRODUCT LEVEL (Wafer Fabrication Manufacturing Sites)
9/1/2018 - PDF - English - JEDEC
Learn More€73.80 -
JEDEC JEP001-2A:2018
FOUNDRY PROCESS QUALIFICATION GUIDELINES - FRONT END TRANSISTOR LEVEL (Wafer Fabrication Manufacturing Sites)
9/1/2018 - PDF - English - JEDEC
Learn More€79.95 -
JEDEC JEP001-1A:2018
FOUNDRY PROCESS QUALIFICATION GUIDELINES - BACKEND OF LINE (Wafer Fabrication Manufacturing Sites)
9/1/2018 - PDF - English - JEDEC
Learn More€68.68 -
JEDEC JEP 001-2A:2018
FOUNDRY PROCESS QUALIFICATION GUIDELINES - FRONT END TRANSISTOR LEVEL (Wafer Fabrication Manufacturing Sites)
9/1/2018 - PDF sécurisé - English - JEDEC
Learn More€85.80 -
JEDEC JEP 001-3A:2018
FOUNDRY PROCESS QUALIFICATION GUIDELINES - PRODUCT LEVEL (Wafer Fabrication Manufacturing Sites)
9/1/2018 - PDF sécurisé - English - JEDEC
Learn More€79.20 -
JEDEC JEP 001-1A:2018
FOUNDRY PROCESS QUALIFICATION GUIDELINES - BACKEND OF LINE (Wafer Fabrication Manufacturing Sites)
9/1/2018 - PDF sécurisé - English - JEDEC
Learn More€73.70 -
€77.90
-
JEDEC JESD 22-B112B:2018
Package Warpage Measurement of Surface-Mount Integrated Circuits at Elevated Temperature
8/1/2018 - PDF sécurisé - English - JEDEC
Learn More€79.20 -
€85.80
-
JEDEC JESD 22-B113B:2018
Board Level Cyclic Bend Test Method for Interconnect Reliability Characterization of SMT ICs for Handheld Electronic Products
8/1/2018 - PDF sécurisé - English - JEDEC
Learn More€73.70 -
JEDEC JESD22-B113B:2018
BOARD LEVEL CYCLIC BEND TEST METHOD FOR INTERCONNECT RELIABILITY CHARACTERIZATION OF SMT ICS FOR HANDHELD ELECTRONIC PRODUCTS
8/1/2018 - PDF - English - JEDEC
Learn More€68.68 -
€73.80
-
€79.95
-
JEDEC JEP 155B:2018
Recommended ESD Target Level for HBM Qualification
7/1/2018 - PDF sécurisé - English - JEDEC
Learn More€100.10 -
€93.28
-
JEDEC JESD671C:2018
Component Quality Problem Analysis and Corrective Action Requirements (Including Administrative Quality Problems)
7/1/2018 - PDF - English - JEDEC
Learn More€63.55 -
JEDEC J-STD-075A:2018
Classification of Passive and Solid State Devices for Assembly Processes
5/1/2018 - PDF sécurisé - English - JEDEC
Learn More€101.20 -
JEDEC J-STD-033D:2018
Handling, Packing, Shipping and Use of Moisture, Reflow, and Process Sensitive Devices
4/1/2018 - - - JEDEC
Learn More€97.90 -
JEDEC J-STD-033D:2018
Handling, Packing, Shipping, and Use of Moisture/Reflow Sensitive Surface-Mount Devices
4/1/2018 - PDF - English - JEDEC
Learn More€91.23 -
JEDEC J-STD-033D:2018
Handling, Packing, Shipping and Use of Moisture, Reflow, and Process Sensitive Devices
4/1/2018 - PDF - English - JEDEC
Learn More€80.98 -
€52.80
-
JEDEC JESD22-A111B:2018
EVALUATION PROCEDURE FOR DETERMINING CAPABILITY TO BOTTOM SIDE BOARD ATTACH BY FULL BODY SOLDER IMMERSION OF SMALL SURFACE MOUNT SOLID STATE DEVICES
3/1/2018 - PDF - English - JEDEC
Learn More€63.55 -
JEDEC JESD72A:2018
TEST METHODS AND ACCEPTANCE PROCEDURES FOR THE EVALUATION OF POLYMERIC MATERIALS
3/1/2018 - PDF - English - JEDEC
Learn More€75.85 -
JEDEC JEP156A:2018
CHIP-PACKAGE INTERACTION UNDERSTANDING, IDENTIFICATION AND EVALUATION
3/1/2018 - PDF - English - JEDEC
Learn More€68.68 -
JEDEC JS709C:2018
Joint JEDEC/ECA Standard: Definition of "Low-Halogen" for Electronic Products
3/1/2018 - PDF - English - JEDEC
Learn More€61.50 -
€82.00
-
€49.20
-
€35.20
-
€63.55
-
JEDEC JEP 131C:2018
Potential Failure Mode and Effects Analysis (FMEA)
1/8/2018 - PDF sécurisé - English - JEDEC
Learn More€79.20 -
JEDEC JESD 251:2018
EXpanded Serial Peripheral Interface (xSPI) for Non Volatile Memory Devices
1/8/2018 - PDF sécurisé - English - JEDEC
Learn More€127.60 -
€390.50
-
JEDEC JESD 223D:2018
Universal Flash Storage Host Controller Interface (UFSHCI) Version 3.0
1/1/2018 - PDF sécurisé - English - JEDEC
Learn More€155.10 -
JEDEC JESD 50C:2018
Special Requirements for Maverick Product Elimination and Outlier Management
1/1/2018 - PDF sécurisé - English - JEDEC
Learn More€66.00 -
€61.60
-
JEDEC JESD 220-2A:2018
Universal Flash Storage (UFS) Card Extension Version 1.1
1/1/2018 - PDF sécurisé - English - JEDEC
Learn More€63.55 -
€63.55
-
€63.55
-
JEDEC JESD50C:2018
SPECIAL REQUIREMENTS FOR MAVERICK PRODUCT ELIMINATION AND OUTLIER MANAGEMENT
1/1/2018 - PDF - English - JEDEC
Learn More€61.50 -
JEDEC JESD223D:2018
Universal Flash Storage Host Controller Interface (UFSHCI)
1/1/2018 - PDF - English - JEDEC
Learn More€144.53 -
€335.50
-
€312.63
-
JEDEC JESD 16B:2017
Assessment of Average Outgoing Quality Levels in Parts Per Million (PPM)
11/1/2017 - PDF sécurisé - English - JEDEC
Learn More€85.80 -
JEDEC JESD 69C:2017
Information Requirements for the Qualification of Silicon Devices
11/1/2017 - PDF sécurisé - English - JEDEC
Learn More€59.40 -
JEDEC JESD69C:2017
INFORMATION REQUIREMENTS FOR THE QUALIFICATION OF SILICON DEVICES
11/1/2017 - PDF - English - JEDEC
Learn More€55.35 -
JEDEC JESD16B:2017
ASSESSMENT OF AVERAGE OUTGOING QUALITY LEVELS IN PARTS PER MILLION (PPM)
11/1/2017 - PDF - English - JEDEC
Learn More€79.95 -
€66.00
-
€210.10
-
JEDEC JESD 214.01:2017
Constant-Temperature Aging Method to Characterize Copper Interconnect Metallization for Stress-Induced Voiding
8/1/2017 - PDF sécurisé - English - JEDEC
Learn More€79.20 -
JEDEC JESD 30H:2017
Descriptive Designation System for Electronic-device Packages
8/1/2017 - PDF sécurisé - English - JEDEC
Learn More€127.60 -
JEDEC JESD 37A:2017
LOGNORMAL ANALYSIS OF UNCENSORED DATA AND OF SINGLY RIGHT-CENSORED DATA UTILIZING THE PERSSON AND ROOTZEN METHOD
8/1/2017 - PDF sécurisé - English - JEDEC
Learn More€83.60 -
JEDEC JESD30H:2017
Descriptive Designation System for Semiconductor-device Packages
8/1/2017 - PDF - English - JEDEC
Learn More€118.90 -
JEDEC JESD37A:2017
Lognormal Analysis of Uncensored Data, and of Singly Right-Censored Data Utilizing the Persson and Rootzen Method
8/1/2017 - PDF - English - JEDEC
Learn More€77.90 -
JEDEC JESD214.01:2017
CONSTANT-TEMPERATURE AGING METHOD TO CHARACTERIZE COPPER INTERCONNECT METALLIZATIONS FOR STRESS-INDUCED VOIDING
8/1/2017 - PDF - English - JEDEC
Learn More€73.80 -
€55.35
-
€61.60
-
€55.35
-
€335.50
-
€312.63
-
€57.40
-
€258.50
-
€312.40
-
€291.10
-
JEDEC JS-001-2017
ESDA/JEDEC Joint Standard for Electrostatic Discharge Sensitivity Testing - Human Body Modal (HBM) - Component Level
5/12/2017 - PDF - English - JEDEC
Learn More€93.28 -
€75.85
-
JEDEC JESD 9C:2017
Inspection Criteria for Microelectronic Packages and Covers
5/1/2017 - PDF sécurisé - English - JEDEC
Learn More€155.10 -
JEDEC JESD9C:2017
Inspection Criteria for Microelectronic Packages and Covers
5/1/2017 - PDF - English - JEDEC
Learn More€144.53 -
€57.40
-
JEDEC JESD213A:2017
STANDARD TEST METHOD UTILIZING X-RAY FLUORESCENCE (XRF) FOR ANALYZING COMPONENT FINISHES AND SOLDER ALLOYS TO DETERMINE TIN (Sn) - LEAD (Pb) CONTENT
4/1/2017 - PDF - English - JEDEC
Learn More€61.50 -
JEDEC JESD 210A:2017
Avalanche Breakdown Diode (ABD) Transient Voltage Suppressors
3/1/2017 - PDF sécurisé - English - JEDEC
Learn More€88.00 -
JEDEC JESD210A:2017
AVALANCHE BREAKDOWN DIODE (ABD) TRANSIENT VOLTAGE SUPPRESSORS
3/1/2017 - PDF - English - JEDEC
Learn More€82.00 -
€335.50
-
€108.65
-
JEDEC JESD209-4-1:2017
Addendum No. 1 to JESD209-4 - Low Power Double Data Rate 4 (LPDDR4)
1/1/2017 - PDF - English - JEDEC
Learn More€82.00 -
JEDEC JESD 8-29:2016
0.6 V Low Voltage Swing Terminated Logic (LVSTL06)
12/1/2016 - PDF sécurisé - English - JEDEC
Learn More€59.40 -
€55.35
-
JEDEC JEP 130B:2016
Guidelines for Packing and Labeling of Integrated Circuits in Unit Container Packing (Tubes, Trays, and Tape and Reel)
11/1/2016 - PDF sécurisé - English - JEDEC
Learn More€59.40 -
JEDEC JESD 31E:2016
General Requirements for Authorized Distributors of Commercial and Military Semiconductor Devices
11/1/2016 - PDF sécurisé - English - JEDEC
Learn More€81.40 -
JEDEC JESD 225:2016
Universal Flash Storage (UFS) Security Extension
11/1/2016 - PDF sécurisé - English - JEDEC
Learn More€85.80 -
JEDEC JESD 227:2016
Embedded Multimediacard (eMMC) Security Extension
11/1/2016 - PDF sécurisé - English - JEDEC
Learn More€73.70 -
EIA JESD 22-A113H:2016
Preconditioning of Nonhermetic Surface Mount Devices Prior to Reliability Testing
11/1/2016 - PDF sécurisé - English - JEDEC
Learn More€54.28 -
JEDEC JESD 22-B111A:2016
Board Level Drop Test Method of Components for Handheld Electronic Products
11/1/2016 - PDF sécurisé - English - JEDEC
Learn More€73.70 -
JEDEC JESD 22-B106E:2016
Resistance to Solder Shock for Through-Hole Mounted Devices
11/1/2016 - PDF sécurisé - English - JEDEC
Learn More€59.40 -
€210.10
-
€68.68
-
JEDEC JESD31E:2016
GENERAL REQUIREMENTS FOR DISTRIBUTORS OF COMMERCIAL AND MILITARY SEMICONDUCTOR DEVICES
11/1/2016 - PDF - English - JEDEC
Learn More€75.85 -
€79.95
-
€52.28
-
JEDEC JESD22-B111A:2016
BOARD LEVEL DROP TEST METHOD OF COMPONENTS FOR HANDHELD ELECTRONIC PRODUCTS
11/1/2016 - PDF - English - JEDEC
Learn More€68.68 -
JEDEC JEP130B:2016
GUIDELINES FOR PACKING AND LABELING OF INTEGRATED CIRCUITS IN UNIT CONTAINER PACKING (TUBES, TRAYS, AND TAPE AND REEL)
11/1/2016 - PDF - English - JEDEC
Learn More€55.35 -
JEDEC JESD22-B106E:2016
RESISTANCE TO SOLDER SHOCK FOR THROUGH-HOLE MOUNTED DEVICES
11/1/2016 - PDF - English - JEDEC
Learn More€55.35 -
€100.10
-
JEDEC JESD 217.01:2016
Test Methods to Characterize Voiding in Pre-SMT Ball Grid Array Packages
10/1/2016 - PDF sécurisé - English - JEDEC
Learn More€95.70 -
JEDEC JESD217.01:2016
TEST METHODS TO CHARACTERIZE VOIDING IN PRE-SMT BALL GRID ARRAY PACKAGES
10/1/2016 - PDF - English - JEDEC
Learn More€89.18 -
€167.08
-
JEDEC JEP 122H:2016
Failure Mechanisms and Models for Semiconductor Devices
9/1/2016 - PDF sécurisé - English - JEDEC
Learn More€179.30 -
€228.80
-
€61.60
-
€57.40
-
€213.20
-
JEDEC JESD 232A:2016
GRAPHICS DOUBLE DATA RATE (GDDR5X) SGRAM STANDARD
8/1/2016 - PDF sécurisé - English - JEDEC
Learn More€228.80 -
€210.10
-
€195.78
-
€213.20
-
€73.70
-
JEDEC J-STD-046:2016
Customer Notification Standard for Product/Process Changes by Electronic Product Suppliers
7/1/2016 - PDF sécurisé - English - JEDEC
Learn More€59.40 -
€68.68
-
JEDEC JESD 218B.01:2016
Solid-State Drive (SSD) Requirements and Endurance Test Method
6/1/2016 - PDF sécurisé - English - JEDEC
Learn More€83.60 -
€73.70
-
€66.00
-
JEDEC JESD218B.01:2016
SOLID STATE DRIVE (SSD) REQUIREMENTS AND ENDURANCE TEST METHOD
6/1/2016 - PDF - English - JEDEC
Learn More€77.90 -
€68.68
-
€61.50
-
€75.85
-
€81.40
-
JEDEC J-STD-609B:2016
MARKING, SYMBOLS, AND LABELS OF LEADED AND LEAD-FREE TERMINAL FINISHED MATERIALS USED IN ELECTRONIC ASSEMBLY
4/1/2016 - PDF - English - JEDEC
Learn More€63.55 -
JEDEC JESD 243:2016
Counterfeit Electronic Parts: Non-Proliferation for Manufacturers
3/1/2016 - PDF sécurisé - English - JEDEC
Learn More€61.60 -
JEDEC JESD 220-1A:2016
Universal Flash Storage (UFS) Unified Memory Extension Version 1.1
3/1/2016 - PDF sécurisé - English - JEDEC
Learn More€100.10 -
JEDEC JESD 223-1A:2016
Universal Flash Storage Host Controller Interface (UFSHCI), Unified Memory Extension Version 1.1
3/1/2016 - PDF sécurisé - English - JEDEC
Learn More€79.20 -
€93.28
-
JEDEC JESD223-1A:2016
Universal Flash Storage Host Controller Interface (UFSHCI), Unified Memory Extension
3/1/2016 - PDF - English - JEDEC
Learn More€73.80 -
JEDEC JESD243:2016
COUNTERFEIT ELECTRONIC PARTS: NON-PROLIFERATION FOR MANUFACTURERS
3/1/2016 - PDF - English - JEDEC
Learn More€57.40 -
JEDEC JESD 212C:2016
GRAPHICS DOUBLE DATA RATE (GDDR5) SGRAM STANDARD
2/1/2016 - PDF sécurisé - English - JEDEC
Learn More€228.80 -
€213.20
-
JEDEC JESD 241:2015
Procedure for Wafer-Level DC Characterization of Bias Temperature Instabilities
12/1/2015 - PDF sécurisé - English - JEDEC
Learn More€81.40 -
JEDEC JEP151:2015
, Test Procedure for the Measurement of Terrestrial Cosmic Ray Induced Destructive Effects in Power Semiconductor Devices
12/1/2015 - PDF - English - JEDEC
Learn More€63.55 -
JEDEC JESD241:2015
Procedure for Wafer-Level DC Characterization of Bias Temperature Instabilities
12/1/2015 - PDF - English - JEDEC
Learn More€75.85 -
JEDEC JESD94B:2015
APPLICATION SPECIFIC QUALIFICATION USING KNOWLEDGE BASED TEST METHODOLOGY
10/1/2015 - PDF - English - JEDEC
Learn More€82.00 -
€54.33
-
€57.40
-
€54.33
-
€52.28
-
JEDEC JEP 163:2015
Selection of Burn-In/Life Test Conditions and Critical Parameters for QML Microcircuits
9/1/2015 - PDF sécurisé - English - JEDEC
Learn More€79.20 -
EIA JEP 151:2015
Test Procedure for the Measurement of Terrestrial Cosmic Ray Induced Destructive Effects in Power Semiconductor Devices
9/1/2015 - PDF - English - JEDEC
Learn More€55.80 -
JEDEC JEP163:2015
SELECTION OF BURN-IN/LIFE TEST CONDITIONS AND CRITICAL PARAMETERS FOR QML MICROCIRCUITS
9/1/2015 - PDF - English - JEDEC
Learn More€73.80 -
€228.80
-
€214.23
-
€54.33
-
€54.33
-
€54.33
-
JEDEC JESD22-A110E:2015
HIGHLY ACCELERATED TEMPERATURE AND HUMIDITY STRESS TEST (HAST)
7/1/2015 - PDF - English - JEDEC
Learn More€55.35 -
JEDEC JEP 159A:2015
Procedure for the Evaluation of Low-k/Metal Inter/Intra-Level Dielectric Integrity
7/1/2015 - PDF sécurisé - English - JEDEC
Learn More€81.40 -
JEDEC JESD 22-A101D:2015
Steady-State Temperature-Humidity Bias Life Test
7/1/2015 - PDF sécurisé - English - JEDEC
Learn More€54.33 -
JEDEC JESD 22-A110E:2015
Highly Accelerated Temperature and Humidity Stress Test (HAST)
7/1/2015 - PDF sécurisé - English - JEDEC
Learn More€55.35 -
JEDEC JEP 172A:2015
Discontinuing Use of the Machine Model for Device ESD Qualification
7/1/2015 - PDF sécurisé - English - JEDEC
Learn More€68.20 -
JEDEC JESD 22-A102E:2015
Accelerated Moisture Resistance - Unbiased Autoclave
7/1/2015 - PDF sécurisé - English - JEDEC
Learn More€54.33 -
JEDEC JEP172A:2015
DISCONTINUING USE OF THE MACHINE MODEL FOR DEVICE ESD QUALIFICATION
7/1/2015 - PDF - English - JEDEC
Learn More€63.55 -
JEDEC JEP159A:2015
PROCEDURE FOR THE EVQLUQTION OF LOW-k/METAL INTER/INTRA-LEVEL DIELECTRIC INTEGRITY
7/1/2015 - PDF - English - JEDEC
Learn More€75.85 -
€56.10
-
€52.28
-
JEDEC J-STD-110:2015
JOINT ATIS/TIA NATIVE SMS/MMS TEXT TO 9-1-1 REQUIREMENTS AND ARCHITECTURE SPECIFICATION RELEASE 2
5/1/2015 - PDF sécurisé - English - JEDEC
Learn More€495.00 -
€81.40
-
€75.85
-
€75.90
-
JEDEC JEP 166A:2014
JC-42.6 Manufacturer Identification (ID) Code for Low Power Memories
12/1/2014 - PDF sécurisé - English - JEDEC
Learn More€58.30 -
JEDEC J-STD-020E:2014
Moisture/Reflow Sensitivity Classification for Nonhermetic Surface Mount Devices
12/1/2014 - PDF sécurisé - English - JEDEC
Learn More€82.50 -
JEDEC J-STD-020E:2014
JOINT IPC/JEDEC STANDARD FOR MOISTURE/REFLOW SENSITIVITY CLASSIFICATION FOR NONHERMETIC SOLID STATE SURFACE-MOUNT DEVICES
12/1/2014 - PDF - English - JEDEC
Learn More€76.88 -
JEDEC JEP166A:2014
JC-42.6 MANUFACTURER IDENTIFICATION (ID) CODE FOR LOW POWER MEMORIES
12/1/2014 - PDF - English - JEDEC
Learn More€54.33 -
EIA J-STD-048:2014
Notification Standard for Product Discontinuance
11/1/2014 - PDF sécurisé - English - JEDEC
Learn More€52.28 -
€52.28
-
€335.50
-
€60.48
-
€68.68
-
€83.60
-
€179.30
-
€118.90
-
€61.60
-
€57.40
-
JEDEC JESD22-A120B:2014
TEST METHOD FOR THE MEASUREMENT OF MOISTURE DIFFUSIVITY AND WATER SOLUBILITY IN ORGANIC MATERIALS USED IN ELECTRONIC DEVICES
7/1/2014 - PDF - English - JEDEC
Learn More€57.40
