JEDEC
-
JEDEC JESD260:2021
Replay Protected Monotonic Counter (RPMC) For Serial Flash Devices
4/1/2021 - PDF - English - JEDEC
Learn More€73.80 -
€54.33
-
JEDEC JEP178:2021
Electrostatic Discharge (ESD) Sensitivity Testing - Reporting ESD Withstand Levels on Datasheets
4/1/2021 - PDF - English - JEDEC
Learn More€55.35 -
€61.50
-
€233.70
-
€108.65
-
€253.18
-
€54.33
-
€60.48
-
€60.48
-
JEDEC JESD22-A100E:2020
Cycled Temperature Humidity-Bias with Surface Condensation Life Test
11/1/2020 - PDF - English - JEDEC
Learn More€52.28 -
JEDEC JEP167A:2020
Characterization of Interfacial Adhesion in Semiconductor Packages
11/1/2020 - PDF - English - JEDEC
Learn More€73.80 -
€195.78
-
JEDEC JESD22-A113I:2020
Preconditioning of Nonhermetic Surface Mount Devices Prior to Reliability Testing
4/1/2020 - PDF - English - JEDEC
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JEDEC JESD251A:2020
Expanded Serial Peripheral Interface (xSPI) for Non Volatile Memory Devices
2/1/2020 - PDF - English - JEDEC
Learn More€118.90 -
JEDEC JESD300-5:2020
SPD5118, SPD5108 Hub and Serial Presence Detect Device Standard
2/1/2020 - PDF - English - JEDEC
Learn More€195.78 -
JEDEC JEP180:2020
Guideline for Switching Reliability Evaluation Procedures for Gallium Nitride Power Conversion Devices
2/1/2020 - PDF - English - JEDEC
Learn More€75.85 -
€54.33
-
€54.33
-
€54.33
-
€378.23
-
€57.40
-
€335.18
-
JEDEC JESD220-3:2020
Universal Flash Storage (UFS) Host Performance Booster (HPB) Extension
1/1/2020 - PDF - English - JEDEC
Learn More€77.90 -
€363.88
-
JEDEC JEP162A:2019
System Level ESD Part II: Implementation of Effective ESD Robust Designs
9/1/2019 - PDF - English - JEDEC
Learn More€195.78 -
€233.70
-
€118.90
-
€55.35
-
€68.68
-
€68.68
-
€61.50
-
€195.78
-
ESDA/JEDEC JS-002:2018
ESDA/JEDEC Joint Standard for Electrostatic Discharge Sensitivity Testing - Charged Device Model (CDM) - Device Level
1/1/2019 - PDF - English - JEDEC
Learn More€186.76 -
EIA JESD 84-B51:2019
Embedded Multi-Media Card (e MMC) Electrical Standard (5.1)
1/1/2019 - PDF sécurisé - English - JEDEC
Learn More€300.84 -
JEDEC JEP143D:2019
SOLID STATE RELIABILITY ASSESSMENT QUALIFICATION METHODOLOGIES
1/1/2019 - PDF - English - JEDEC
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JEDEC JESD84-B51A:2019
Embedded Multi-media card (e*MMC), Electrical Standard (5.1)
1/1/2019 - PDF - English - JEDEC
Learn More€335.18 -
€73.80
-
JEDEC JESD22-A117E:2018
ELECTRICALLY ERASABLE PROGRAMMABLE ROM (EEPROM) PROGRAM/ERASE ENDURANCE AND DATA RETENTION TEST
11/1/2018 - PDF - English - JEDEC
Learn More€68.68 -
€213.20
-
€54.33
-
JEDEC JESD251-1:2018
Addendum No. 1 to JESD251, Optional x4 Quad I/O With Data Strobe
10/1/2018 - PDF - English - JEDEC
Learn More€63.55 -
JEDEC JEP001-3A:2018
FOUNDRY PROCESS QUALIFICATION GUIDELINES - PRODUCT LEVEL (Wafer Fabrication Manufacturing Sites)
9/1/2018 - PDF - English - JEDEC
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JEDEC JEP001-2A:2018
FOUNDRY PROCESS QUALIFICATION GUIDELINES - FRONT END TRANSISTOR LEVEL (Wafer Fabrication Manufacturing Sites)
9/1/2018 - PDF - English - JEDEC
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JEDEC JEP001-1A:2018
FOUNDRY PROCESS QUALIFICATION GUIDELINES - BACKEND OF LINE (Wafer Fabrication Manufacturing Sites)
9/1/2018 - PDF - English - JEDEC
Learn More€68.68 -
€77.90
-
JEDEC JESD22-B113B:2018
BOARD LEVEL CYCLIC BEND TEST METHOD FOR INTERCONNECT RELIABILITY CHARACTERIZATION OF SMT ICS FOR HANDHELD ELECTRONIC PRODUCTS
8/1/2018 - PDF - English - JEDEC
Learn More€68.68 -
€73.80
-
€79.95
-
€93.28
-
JEDEC JESD671C:2018
Component Quality Problem Analysis and Corrective Action Requirements (Including Administrative Quality Problems)
7/1/2018 - PDF - English - JEDEC
Learn More€63.55 -
JEDEC J-STD-033D:2018
Handling, Packing, Shipping, and Use of Moisture/Reflow Sensitive Surface-Mount Devices
4/1/2018 - PDF - English - JEDEC
Learn More€91.23 -
JEDEC J-STD-033D:2018
Handling, Packing, Shipping and Use of Moisture, Reflow, and Process Sensitive Devices
4/1/2018 - PDF - English - JEDEC
Learn More€80.98 -
JEDEC JESD22-A111B:2018
EVALUATION PROCEDURE FOR DETERMINING CAPABILITY TO BOTTOM SIDE BOARD ATTACH BY FULL BODY SOLDER IMMERSION OF SMALL SURFACE MOUNT SOLID STATE DEVICES
3/1/2018 - PDF - English - JEDEC
Learn More€63.55 -
JEDEC JESD72A:2018
TEST METHODS AND ACCEPTANCE PROCEDURES FOR THE EVALUATION OF POLYMERIC MATERIALS
3/1/2018 - PDF - English - JEDEC
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JEDEC JEP156A:2018
CHIP-PACKAGE INTERACTION UNDERSTANDING, IDENTIFICATION AND EVALUATION
3/1/2018 - PDF - English - JEDEC
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JEDEC JS709C:2018
Joint JEDEC/ECA Standard: Definition of "Low-Halogen" for Electronic Products
3/1/2018 - PDF - English - JEDEC
Learn More€61.50 -
€82.00
-
€49.20
-
€63.55
-
JEDEC JESD 251:2018
EXpanded Serial Peripheral Interface (xSPI) for Non Volatile Memory Devices
1/8/2018 - PDF sécurisé - English - JEDEC
Learn More€127.60 -
€390.50
-
JEDEC JESD 223D:2018
Universal Flash Storage Host Controller Interface (UFSHCI) Version 3.0
1/1/2018 - PDF sécurisé - English - JEDEC
Learn More€155.10 -
€63.55
-
€63.55
-
JEDEC JESD50C:2018
SPECIAL REQUIREMENTS FOR MAVERICK PRODUCT ELIMINATION AND OUTLIER MANAGEMENT
1/1/2018 - PDF - English - JEDEC
Learn More€61.50 -
JEDEC JESD223D:2018
Universal Flash Storage Host Controller Interface (UFSHCI)
1/1/2018 - PDF - English - JEDEC
Learn More€144.53 -
€335.50
-
€312.63
-
JEDEC JESD69C:2017
INFORMATION REQUIREMENTS FOR THE QUALIFICATION OF SILICON DEVICES
11/1/2017 - PDF - English - JEDEC
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JEDEC JESD16B:2017
ASSESSMENT OF AVERAGE OUTGOING QUALITY LEVELS IN PARTS PER MILLION (PPM)
11/1/2017 - PDF - English - JEDEC
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€210.10
-
JEDEC JESD 30H:2017
Descriptive Designation System for Electronic-device Packages
8/1/2017 - PDF sécurisé - English - JEDEC
Learn More€127.60 -
JEDEC JESD30H:2017
Descriptive Designation System for Semiconductor-device Packages
8/1/2017 - PDF - English - JEDEC
Learn More€118.90 -
JEDEC JESD37A:2017
Lognormal Analysis of Uncensored Data, and of Singly Right-Censored Data Utilizing the Persson and Rootzen Method
8/1/2017 - PDF - English - JEDEC
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JEDEC JESD214.01:2017
CONSTANT-TEMPERATURE AGING METHOD TO CHARACTERIZE COPPER INTERCONNECT METALLIZATIONS FOR STRESS-INDUCED VOIDING
8/1/2017 - PDF - English - JEDEC
Learn More€73.80 -
€55.35
-
€335.50
-
€312.63
-
€57.40
-
€258.50
-
€312.40
-
€291.10
-
JEDEC JS-001-2017
ESDA/JEDEC Joint Standard for Electrostatic Discharge Sensitivity Testing - Human Body Modal (HBM) - Component Level
5/12/2017 - PDF - English - JEDEC
Learn More€93.28 -
€75.85
-
JEDEC JESD 9C:2017
Inspection Criteria for Microelectronic Packages and Covers
5/1/2017 - PDF sécurisé - English - JEDEC
Learn More€155.10 -
JEDEC JESD9C:2017
Inspection Criteria for Microelectronic Packages and Covers
5/1/2017 - PDF - English - JEDEC
Learn More€144.53 -
€57.40
-
JEDEC JESD213A:2017
STANDARD TEST METHOD UTILIZING X-RAY FLUORESCENCE (XRF) FOR ANALYZING COMPONENT FINISHES AND SOLDER ALLOYS TO DETERMINE TIN (Sn) - LEAD (Pb) CONTENT
4/1/2017 - PDF - English - JEDEC
Learn More€61.50 -
JEDEC JESD210A:2017
AVALANCHE BREAKDOWN DIODE (ABD) TRANSIENT VOLTAGE SUPPRESSORS
3/1/2017 - PDF - English - JEDEC
Learn More€82.00 -
€335.50
-
JEDEC JESD209-4-1:2017
Addendum No. 1 to JESD209-4 - Low Power Double Data Rate 4 (LPDDR4)
1/1/2017 - PDF - English - JEDEC
Learn More€82.00 -
€55.35
-
€210.10
-
€68.68
-
JEDEC JESD31E:2016
GENERAL REQUIREMENTS FOR DISTRIBUTORS OF COMMERCIAL AND MILITARY SEMICONDUCTOR DEVICES
11/1/2016 - PDF - English - JEDEC
Learn More€75.85 -
€79.95
-
€52.28
-
JEDEC JESD22-B111A:2016
BOARD LEVEL DROP TEST METHOD OF COMPONENTS FOR HANDHELD ELECTRONIC PRODUCTS
11/1/2016 - PDF - English - JEDEC
Learn More€68.68 -
JEDEC JEP130B:2016
GUIDELINES FOR PACKING AND LABELING OF INTEGRATED CIRCUITS IN UNIT CONTAINER PACKING (TUBES, TRAYS, AND TAPE AND REEL)
11/1/2016 - PDF - English - JEDEC
Learn More€55.35 -
JEDEC JESD22-B106E:2016
RESISTANCE TO SOLDER SHOCK FOR THROUGH-HOLE MOUNTED DEVICES
11/1/2016 - PDF - English - JEDEC
Learn More€55.35 -
JEDEC JESD217.01:2016
TEST METHODS TO CHARACTERIZE VOIDING IN PRE-SMT BALL GRID ARRAY PACKAGES
10/1/2016 - PDF - English - JEDEC
Learn More€89.18 -
€167.08
-
JEDEC JEP 122H:2016
Failure Mechanisms and Models for Semiconductor Devices
9/1/2016 - PDF sécurisé - English - JEDEC
Learn More€179.30 -
€228.80
-
€57.40
-
€213.20
-
JEDEC JESD 232A:2016
GRAPHICS DOUBLE DATA RATE (GDDR5X) SGRAM STANDARD
8/1/2016 - PDF sécurisé - English - JEDEC
Learn More€228.80 -
€210.10
-
€195.78
-
€213.20
-
€68.68
-
JEDEC JESD218B.01:2016
SOLID STATE DRIVE (SSD) REQUIREMENTS AND ENDURANCE TEST METHOD
6/1/2016 - PDF - English - JEDEC
Learn More€77.90 -
€68.68
-
€61.50
-
€75.85
-
JEDEC J-STD-609B:2016
MARKING, SYMBOLS, AND LABELS OF LEADED AND LEAD-FREE TERMINAL FINISHED MATERIALS USED IN ELECTRONIC ASSEMBLY
4/1/2016 - PDF - English - JEDEC
Learn More€63.55 -
€93.28
-
JEDEC JESD223-1A:2016
Universal Flash Storage Host Controller Interface (UFSHCI), Unified Memory Extension
3/1/2016 - PDF - English - JEDEC
Learn More€73.80 -
JEDEC JESD243:2016
COUNTERFEIT ELECTRONIC PARTS: NON-PROLIFERATION FOR MANUFACTURERS
3/1/2016 - PDF - English - JEDEC
Learn More€57.40 -
JEDEC JESD 212C:2016
GRAPHICS DOUBLE DATA RATE (GDDR5) SGRAM STANDARD
2/1/2016 - PDF sécurisé - English - JEDEC
Learn More€228.80 -
€213.20
-
JEDEC JEP151:2015
, Test Procedure for the Measurement of Terrestrial Cosmic Ray Induced Destructive Effects in Power Semiconductor Devices
12/1/2015 - PDF - English - JEDEC
Learn More€63.55 -
JEDEC JESD241:2015
Procedure for Wafer-Level DC Characterization of Bias Temperature Instabilities
12/1/2015 - PDF - English - JEDEC
Learn More€75.85 -
JEDEC JESD94B:2015
APPLICATION SPECIFIC QUALIFICATION USING KNOWLEDGE BASED TEST METHODOLOGY
10/1/2015 - PDF - English - JEDEC
Learn More€82.00 -
€54.33
-
€57.40
-
€52.28
-
JEDEC JEP163:2015
SELECTION OF BURN-IN/LIFE TEST CONDITIONS AND CRITICAL PARAMETERS FOR QML MICROCIRCUITS
9/1/2015 - PDF - English - JEDEC
Learn More€73.80 -
€228.80
-
€214.23
-
€54.33
-
€54.33
-
JEDEC JESD22-A110E:2015
HIGHLY ACCELERATED TEMPERATURE AND HUMIDITY STRESS TEST (HAST)
7/1/2015 - PDF - English - JEDEC
Learn More€55.35 -
JEDEC JEP172A:2015
DISCONTINUING USE OF THE MACHINE MODEL FOR DEVICE ESD QUALIFICATION
7/1/2015 - PDF - English - JEDEC
Learn More€63.55 -
JEDEC JEP159A:2015
PROCEDURE FOR THE EVQLUQTION OF LOW-k/METAL INTER/INTRA-LEVEL DIELECTRIC INTEGRITY
7/1/2015 - PDF - English - JEDEC
Learn More€75.85 -
€52.28
-
JEDEC J-STD-110:2015
JOINT ATIS/TIA NATIVE SMS/MMS TEXT TO 9-1-1 REQUIREMENTS AND ARCHITECTURE SPECIFICATION RELEASE 2
5/1/2015 - PDF sécurisé - English - JEDEC
Learn More€495.00 -
€75.85
-
JEDEC J-STD-020E:2014
JOINT IPC/JEDEC STANDARD FOR MOISTURE/REFLOW SENSITIVITY CLASSIFICATION FOR NONHERMETIC SOLID STATE SURFACE-MOUNT DEVICES
12/1/2014 - PDF - English - JEDEC
Learn More€76.88 -
JEDEC JEP166A:2014
JC-42.6 MANUFACTURER IDENTIFICATION (ID) CODE FOR LOW POWER MEMORIES
12/1/2014 - PDF - English - JEDEC
Learn More€54.33 -
€52.28
-
€335.50
-
€68.68
-
€179.30
-
€118.90
-
€57.40
-
JEDEC JESD22-A120B:2014
TEST METHOD FOR THE MEASUREMENT OF MOISTURE DIFFUSIVITY AND WATER SOLUBILITY IN ORGANIC MATERIALS USED IN ELECTRONIC DEVICES
7/1/2014 - PDF - English - JEDEC
Learn More€57.40 -
€63.55
-
€79.95
-
JEDEC JEP153A:2014 (R2019)
CHARACTERIZATION AND MONITORING OF THERMAL STRESS TEST OVEN TEMPURATURES
3/1/2014 - PDF - English - JEDEC
Learn More€61.50 -
€68.68
-
JEDEC JP001A:2014
FOUNDRY PROCESS QUALIFICATION GUIDELINES (Wafer Fabrication Manufacturing Sites)
2/1/2014 - PDF - English - JEDEC
Learn More€89.18 -
JEDEC J-STD-111:2014
Joint ATIS/TIA Standard on Coexistence and Interference Issues in Land Mobile Systems
1/1/2014 - PDF sécurisé - English - JEDEC
Learn More€517.00 -
€70.73
-
€77.90
-
JEDEC JEP148B:2014
RELIABILITY QUALIFICATION OF SEMICONDUCTOR DEVICES BASED ON PHYSICS OF FAILURE RISK AND OPPORTUNITY ASSESSMENT
1/1/2014 - PDF - English - JEDEC
Learn More€79.95 -
€127.60
-
€118.90
-
JEDEC JEP 70C:2013
Guide to Standards and Publications Relating to Quality and Reliability of Electronic Hardware
10/1/2013 - PDF sécurisé - English - JEDEC
Learn More€116.60 -
JEDEC JESD234:2013
Test Standard for the Measurement of Proton Radiation Single Event Effects in Electronic Devices
10/1/2013 - PDF - English - JEDEC
Learn More€79.95 -
€73.80
-
€61.50
-
JEDEC JEP70C:2013
Guide to Standards and Publications Relating to Quality and Reliability of Electronic Hardware
10/1/2013 - PDF - English - JEDEC
Learn More€108.65 -
JEDEC JESD84-B50:2013
Embedded Multi-media card (e*MMC), Electrical Standard 5.0
9/1/2013 - PDF - English - JEDEC
Learn More€312.63 -
JEDEC JESD 88E:2013
JEDEC Dictionary of Terms for Solid-State Technology
6/1/2013 - PDF sécurisé - English - JEDEC
Learn More€165.00 -
€312.63
-
JEDEC JEP150.01:2013
STRESS-TEST-DRIVEN QUALIFICATION OF AND FAILURE MECHANISMS ASSOCIATED WITH ASSEMBLED SOLID STATE SURFACE-MOUNT COMPONENTS
6/1/2013 - PDF - English - JEDEC
Learn More€68.68 -
JEDEC JESD88E:2013
JEDEC Dictionary of Terms for Solid-State Technology, Sixth Edition
6/1/2013 - PDF - English - JEDEC
Learn More€153.75 -
€49.20
-
JEDEC JEP 162:2013
System Level ESD Part II: Implementation of Effective ESD Robust Designs
1/1/2013 - PDF sécurisé - English - JEDEC
Learn More€210.10 -
€61.50
-
JEDEC JESD79-3-1A:2013
Addendum No. 1 to JESD79-3 - 1.35 V DDR3L-800, DDR3L-1066, DDR3L-1333, and DDR3L-1600
1/1/2013 - PDF - English - JEDEC
Learn More€68.68 -
JEDEC JEP170:2013
Guidelines for Visual Inspection and Control of Flip Chip Type Components (FCxGA)
1/1/2013 - PDF - English - JEDEC
Learn More€60.48 -
JEDEC JESD 99C:2012
Terms, Definitions, and Letter Symbols for Microelectronic Devices
12/1/2012 - PDF sécurisé - English - JEDEC
Learn More€179.30 -
JEDEC JESD99C:2012
Terms, Definitions, and Letter Symbols for Microelectronic Devices
12/1/2012 - PDF - English - JEDEC
Learn More€167.08 -
JEDEC JESD211.01:2012
ZENER AND VOLTAGE REGULATOR DIODE RATING VERIFICATION AND CHARACTERIZATION TESTING
11/1/2012 - PDF - English - JEDEC
Learn More€70.73 -
JEDEC JESD51-12.01:2012
GUIDELINES FOR REPORTING AND USING ELECTRONIC PACKAGE THERMAL INFORMATION
11/1/2012 - PDF - English - JEDEC
Learn More€73.80 -
JEDEC JESD 77D:2012
Terms, Definitions, and Letter Symbols for Discrete Semiconductor and Optoelectronic Devices
8/1/2012 - PDF sécurisé - English - JEDEC
Learn More€250.80 -
JEDEC JESD77D:2012
Terms, Definitions, and Letter Symbols for Discrete Semiconductor and Optoelectronic Devices
8/1/2012 - PDF sécurisé - English - JEDEC
Learn More€233.70 -
€271.70
-
€68.68
-
€68.68
-
€68.68
-
€335.50
-
JEDEC JESD51-53:2012
TERMS, DEFINITIONS AND UNITS GLOSSARY FOR LED THERMAL TESTING
5/1/2012 - PDF - English - JEDEC
Learn More€57.40 -
JEDEC JESD51-50:2012
Overview of Methodologies for the Thermal Measurement of Single- and Multi-Chip, Single- and Multi-PN-Junction Light-Emotting Diodes (LEDs)
4/18/2012 - PDF - English - JEDEC
Learn More€54.33 -
JEDEC JESD51-51:2012
Implementation of the Electrical Test Method for the Measurement of Real Thermal Resistance and Impedance of Light-emitting Diodes with Exposed Cooling Surface
4/18/2012 - PDF - English - JEDEC
Learn More€73.80 -
JEDEC JESD51-52:2012
Guidelines for Combining CIE 127-2007 Total Flux Measurements with Thermal Measurements of LEDs with Exposed Cooling Surface
4/1/2012 - PDF - English - JEDEC
Learn More€60.48 -
JEDEC JESD625B:2011
REQUIREMENTS FOR HANDLING ELECTROSTATIC-DISCHARGE-SENSITIVE (ESDS) DEVICES
1/1/2012 - PDF - English - JEDEC
Learn More€75.85 -
€127.60
-
€118.90
-
EIA JEP 160:2011
Long-Term Storage for Electronic Solid-State Wafers, Dice, and Devices
11/1/2011 - PDF sécurisé - English - JEDEC
Learn More€68.68 -
JEDEC JEP144A:2011
GUIDELINE FOR RESIDUAL GAS ANALYSIS (RGA) FOR MICROELECTRONIC PACKAGES
11/1/2011 - PDF - English - JEDEC
Learn More€58.43 -
JEDEC JEP160:2011
Long-Term Storage for Electronic Solid-State Wafers, Dice, and Devices
11/1/2011 - PDF - English - JEDEC
Learn More€68.68 -
€49.20
-
JEDEC JESD79-3-2:2011
Addendum No. 2 to JESD79-3 - 1.35 V DDR3L-800, DDR3L-1066, DDR3L-1333, and DDR3L-1600
10/1/2011 - PDF - English - JEDEC
Learn More€60.48 -
€49.20
-
€57.40
-
JEDEC J-STD-101:2011
JOINT ATIS/TIA CMAS ALERT GATEWAY TO CMSP GATEWAY INTERFACE SPECIFICATION
8/1/2011 - PDF sécurisé - English - JEDEC
Learn More€440.00
