JEDEC
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JEDEC JESD22-A113I:2020
Preconditioning of Nonhermetic Surface Mount Devices Prior to Reliability Testing
4/1/2020 - PDF - English - JEDEC
Learn More€79.95 -
€54.33
-
JEDEC JEP 143D:2019
Solid-State Reliability Assessment and Qualification Methodologies
1/1/2019 - PDF sécurisé - English - JEDEC
Learn More€85.80 -
EIA JESD 84-B51:2019
Embedded Multi-Media Card (e MMC) Electrical Standard (5.1)
1/1/2019 - PDF sécurisé - English - JEDEC
Learn More€300.84 -
ESDA/JEDEC JS-002:2018
ESDA/JEDEC Joint Standard for Electrostatic Discharge Sensitivity Testing - Charged Device Model (CDM) - Device Level
1/1/2019 - PDF - English - JEDEC
Learn More€186.76 -
JEDEC JEP 001-3A:2018
FOUNDRY PROCESS QUALIFICATION GUIDELINES - PRODUCT LEVEL (Wafer Fabrication Manufacturing Sites)
9/1/2018 - PDF sécurisé - English - JEDEC
Learn More€79.20 -
JEDEC JEP 001-2A:2018
FOUNDRY PROCESS QUALIFICATION GUIDELINES - FRONT END TRANSISTOR LEVEL (Wafer Fabrication Manufacturing Sites)
9/1/2018 - PDF sécurisé - English - JEDEC
Learn More€85.80 -
JEDEC JEP 001-1A:2018
FOUNDRY PROCESS QUALIFICATION GUIDELINES - BACKEND OF LINE (Wafer Fabrication Manufacturing Sites)
9/1/2018 - PDF sécurisé - English - JEDEC
Learn More€73.70 -
JEDEC JESD 22-B112B:2018
Package Warpage Measurement of Surface-Mount Integrated Circuits at Elevated Temperature
8/1/2018 - PDF sécurisé - English - JEDEC
Learn More€79.20 -
€85.80
-
JEDEC JESD 22-B113B:2018
Board Level Cyclic Bend Test Method for Interconnect Reliability Characterization of SMT ICs for Handheld Electronic Products
8/1/2018 - PDF sécurisé - English - JEDEC
Learn More€73.70 -
JEDEC JEP 155B:2018
Recommended ESD Target Level for HBM Qualification
7/1/2018 - PDF sécurisé - English - JEDEC
Learn More€100.10 -
JEDEC J-STD-075A:2018
Classification of Passive and Solid State Devices for Assembly Processes
5/1/2018 - PDF sécurisé - English - JEDEC
Learn More€101.20 -
JEDEC J-STD-033D:2018
Handling, Packing, Shipping and Use of Moisture, Reflow, and Process Sensitive Devices
4/1/2018 - - - JEDEC
Learn More€97.90 -
€52.80
-
€35.20
-
JEDEC JEP 131C:2018
Potential Failure Mode and Effects Analysis (FMEA)
1/8/2018 - PDF sécurisé - English - JEDEC
Learn More€79.20 -
JEDEC JESD 251:2018
EXpanded Serial Peripheral Interface (xSPI) for Non Volatile Memory Devices
1/8/2018 - PDF sécurisé - English - JEDEC
Learn More€127.60 -
JEDEC JESD 50C:2018
Special Requirements for Maverick Product Elimination and Outlier Management
1/1/2018 - PDF sécurisé - English - JEDEC
Learn More€66.00 -
€61.60
-
JEDEC JESD 223D:2018
Universal Flash Storage Host Controller Interface (UFSHCI) Version 3.0
1/1/2018 - PDF sécurisé - English - JEDEC
Learn More€155.10 -
€390.50
-
JEDEC JESD 220-2A:2018
Universal Flash Storage (UFS) Card Extension Version 1.1
1/1/2018 - PDF sécurisé - English - JEDEC
Learn More€63.55 -
€335.50
-
JEDEC JESD 16B:2017
Assessment of Average Outgoing Quality Levels in Parts Per Million (PPM)
11/1/2017 - PDF sécurisé - English - JEDEC
Learn More€85.80 -
JEDEC JESD 69C:2017
Information Requirements for the Qualification of Silicon Devices
11/1/2017 - PDF sécurisé - English - JEDEC
Learn More€59.40 -
€210.10
-
€66.00
-
JEDEC JESD 30H:2017
Descriptive Designation System for Electronic-device Packages
8/1/2017 - PDF sécurisé - English - JEDEC
Learn More€127.60 -
JEDEC JESD 214.01:2017
Constant-Temperature Aging Method to Characterize Copper Interconnect Metallization for Stress-Induced Voiding
8/1/2017 - PDF sécurisé - English - JEDEC
Learn More€79.20 -
JEDEC JESD 37A:2017
LOGNORMAL ANALYSIS OF UNCENSORED DATA AND OF SINGLY RIGHT-CENSORED DATA UTILIZING THE PERSSON AND ROOTZEN METHOD
8/1/2017 - PDF sécurisé - English - JEDEC
Learn More€83.60 -
€55.35
-
€61.60
-
€335.50
-
€258.50
-
€312.40
-
JEDEC JESD 9C:2017
Inspection Criteria for Microelectronic Packages and Covers
5/1/2017 - PDF sécurisé - English - JEDEC
Learn More€155.10 -
JEDEC JESD 210A:2017
Avalanche Breakdown Diode (ABD) Transient Voltage Suppressors
3/1/2017 - PDF sécurisé - English - JEDEC
Learn More€88.00 -
€335.50
-
JEDEC JESD 8-29:2016
0.6 V Low Voltage Swing Terminated Logic (LVSTL06)
12/1/2016 - PDF sécurisé - English - JEDEC
Learn More€59.40 -
JEDEC JESD 225:2016
Universal Flash Storage (UFS) Security Extension
11/1/2016 - PDF sécurisé - English - JEDEC
Learn More€85.80 -
JEDEC JEP 130B:2016
Guidelines for Packing and Labeling of Integrated Circuits in Unit Container Packing (Tubes, Trays, and Tape and Reel)
11/1/2016 - PDF sécurisé - English - JEDEC
Learn More€59.40 -
JEDEC JESD 31E:2016
General Requirements for Authorized Distributors of Commercial and Military Semiconductor Devices
11/1/2016 - PDF sécurisé - English - JEDEC
Learn More€81.40 -
JEDEC JESD 227:2016
Embedded Multimediacard (eMMC) Security Extension
11/1/2016 - PDF sécurisé - English - JEDEC
Learn More€73.70 -
JEDEC JESD 22-B111A:2016
Board Level Drop Test Method of Components for Handheld Electronic Products
11/1/2016 - PDF sécurisé - English - JEDEC
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JEDEC JESD 22-B106E:2016
Resistance to Solder Shock for Through-Hole Mounted Devices
11/1/2016 - PDF sécurisé - English - JEDEC
Learn More€59.40 -
€210.10
-
EIA JESD 22-A113H:2016
Preconditioning of Nonhermetic Surface Mount Devices Prior to Reliability Testing
11/1/2016 - PDF sécurisé - English - JEDEC
Learn More€54.28 -
€100.10
-
JEDEC JESD 217.01:2016
Test Methods to Characterize Voiding in Pre-SMT Ball Grid Array Packages
10/1/2016 - PDF sécurisé - English - JEDEC
Learn More€95.70 -
JEDEC JEP 122H:2016
Failure Mechanisms and Models for Semiconductor Devices
9/1/2016 - PDF sécurisé - English - JEDEC
Learn More€179.30 -
€228.80
-
€61.60
-
JEDEC JESD 232A:2016
GRAPHICS DOUBLE DATA RATE (GDDR5X) SGRAM STANDARD
8/1/2016 - PDF sécurisé - English - JEDEC
Learn More€228.80 -
€210.10
-
€73.70
-
JEDEC J-STD-046:2016
Customer Notification Standard for Product/Process Changes by Electronic Product Suppliers
7/1/2016 - PDF sécurisé - English - JEDEC
Learn More€59.40 -
JEDEC JESD 218B.01:2016
Solid-State Drive (SSD) Requirements and Endurance Test Method
6/1/2016 - PDF sécurisé - English - JEDEC
Learn More€83.60 -
€73.70
-
€66.00
-
€81.40
-
JEDEC JESD 220-1A:2016
Universal Flash Storage (UFS) Unified Memory Extension Version 1.1
3/1/2016 - PDF sécurisé - English - JEDEC
Learn More€100.10 -
JEDEC JESD 223-1A:2016
Universal Flash Storage Host Controller Interface (UFSHCI), Unified Memory Extension Version 1.1
3/1/2016 - PDF sécurisé - English - JEDEC
Learn More€79.20 -
JEDEC JESD 243:2016
Counterfeit Electronic Parts: Non-Proliferation for Manufacturers
3/1/2016 - PDF sécurisé - English - JEDEC
Learn More€61.60 -
JEDEC JESD 212C:2016
GRAPHICS DOUBLE DATA RATE (GDDR5) SGRAM STANDARD
2/1/2016 - PDF sécurisé - English - JEDEC
Learn More€228.80 -
JEDEC JESD 241:2015
Procedure for Wafer-Level DC Characterization of Bias Temperature Instabilities
12/1/2015 - PDF sécurisé - English - JEDEC
Learn More€81.40 -
€54.33
-
JEDEC JEP 163:2015
Selection of Burn-In/Life Test Conditions and Critical Parameters for QML Microcircuits
9/1/2015 - PDF sécurisé - English - JEDEC
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EIA JEP 151:2015
Test Procedure for the Measurement of Terrestrial Cosmic Ray Induced Destructive Effects in Power Semiconductor Devices
9/1/2015 - PDF - English - JEDEC
Learn More€55.80 -
€228.80
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JEDEC JESD 22-A101D:2015
Steady-State Temperature-Humidity Bias Life Test
7/1/2015 - PDF sécurisé - English - JEDEC
Learn More€54.33 -
JEDEC JEP 172A:2015
Discontinuing Use of the Machine Model for Device ESD Qualification
7/1/2015 - PDF sécurisé - English - JEDEC
Learn More€68.20 -
JEDEC JESD 22-A102E:2015
Accelerated Moisture Resistance - Unbiased Autoclave
7/1/2015 - PDF sécurisé - English - JEDEC
Learn More€54.33 -
JEDEC JEP 159A:2015
Procedure for the Evaluation of Low-k/Metal Inter/Intra-Level Dielectric Integrity
7/1/2015 - PDF sécurisé - English - JEDEC
Learn More€81.40 -
JEDEC JESD 22-A110E:2015
Highly Accelerated Temperature and Humidity Stress Test (HAST)
7/1/2015 - PDF sécurisé - English - JEDEC
Learn More€55.35 -
€56.10
-
JEDEC J-STD-110:2015
JOINT ATIS/TIA NATIVE SMS/MMS TEXT TO 9-1-1 REQUIREMENTS AND ARCHITECTURE SPECIFICATION RELEASE 2
5/1/2015 - PDF sécurisé - English - JEDEC
Learn More€495.00 -
€81.40
-
€75.90
-
JEDEC JEP 166A:2014
JC-42.6 Manufacturer Identification (ID) Code for Low Power Memories
12/1/2014 - PDF sécurisé - English - JEDEC
Learn More€58.30 -
JEDEC J-STD-020E:2014
Moisture/Reflow Sensitivity Classification for Nonhermetic Surface Mount Devices
12/1/2014 - PDF sécurisé - English - JEDEC
Learn More€82.50 -
EIA J-STD-048:2014
Notification Standard for Product Discontinuance
11/1/2014 - PDF sécurisé - English - JEDEC
Learn More€52.28 -
€60.48
-
€335.50
-
€83.60
-
€179.30
-
€61.60
-
€63.55
-
JEDEC JESD 8-22B:2014
HSUL 12 LPDDR2 and LPDDR3 I/O with Optional ODT
4/1/2014 - PDF sécurisé - English - JEDEC
Learn More€85.80 -
JEDEC JESD 237:2014
Reliability Qualification of Power Amplifier Modules
3/1/2014 - PDF sécurisé - English - JEDEC
Learn More€73.70 -
€56.10
-
JEDEC JEP 148B:2014
Reliability Qualification of Semiconductor Devices Based on Physics of Failure Risk and Opportunity Assessment
1/1/2014 - PDF sécurisé - English - JEDEC
Learn More€85.80 -
JEDEC J-STD-111:2014
Joint ATIS/TIA Standard on Coexistence and Interference Issues in Land Mobile Systems
1/1/2014 - PDF sécurisé - English - JEDEC
Learn More€517.00 -
€127.60
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JEDEC JESD 234:2013
TEST STANDARD FOR THE MEASUREMENT OF PROTON RADIATION SINGLE EVENT EFFECTS IN ELECTRONIC DEVICES
10/1/2013 - PDF sécurisé - English - JEDEC
Learn More€85.80 -
€79.20
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JEDEC JEP 70C:2013
Guide to Standards and Publications Relating to Quality and Reliability of Electronic Hardware
10/1/2013 - PDF sécurisé - English - JEDEC
Learn More€116.60 -
JEDEC JESD 49A.01:2013
Procurement Standard for Semiconductor Die Products Including Known Good Die (KGD)
10/1/2013 - PDF sécurisé - English - JEDEC
Learn More€66.00 -
€90.20
-
€59.40
-
€58.30
-
JEDEC JESD 88E:2013
JEDEC Dictionary of Terms for Solid-State Technology
6/1/2013 - PDF sécurisé - English - JEDEC
Learn More€165.00 -
JEDEC JEP 150.01:2013
Stress-Test-Driven Qualification of and Failure Mechanisms Associated with Assembled Solid State Surface-Mount Components
6/1/2013 - PDF sécurisé - English - JEDEC
Learn More€73.70 -
JEDEC JESD 79-3-1A.01:2013
Addendum No. 1 to JESD79-3 - 1.35 V DDR3L-800, DDR3L-1066, DDR3L-1333, DDR3L-1600, and DDR3L-1866
5/1/2013 - PDF sécurisé - English - JEDEC
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JEDEC JEP 167:2013
Characterization of Interfacial Adhesion in Semiconductor Packages
4/1/2013 - PDF sécurisé - English - JEDEC
Learn More€79.20 -
JEDEC J-STD-025-B-3:2013
Lawfully Authorized Electronic Surveillance (LAES) Addendum 3- Support for BSID or Subnet
3/8/2013 - PDF sécurisé - English - JEDEC
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JEDEC JEP 170:2013
Guidelines for Visual Inspection and Control of Flip Chip Type Components (FCxGA)
1/1/2013 - PDF sécurisé - English - JEDEC
Learn More€64.90 -
€66.00
-
JEDEC JEP 162:2013
System Level ESD Part II: Implementation of Effective ESD Robust Designs
1/1/2013 - PDF sécurisé - English - JEDEC
Learn More€210.10 -
JEDEC JESD 99C:2012
Terms, Definitions, and Letter Symbols for Microelectronic Devices
12/1/2012 - PDF sécurisé - English - JEDEC
Learn More€179.30 -
JEDEC J-STD-100A:2012
JOINT ATIS/TIA CMAS MOBILE DEVICE BEHAVIOR SPECIFICATION
12/1/2012 - PDF sécurisé - English - JEDEC
Learn More€55.00 -
JEDEC J-STD-102A:2012
JOINT ATIS/TIA CMAS FEDERAL ALERT GATEWAY TO CMSP GATEWAY INTERFACE TEST SPECIFICATION
12/1/2012 - PDF sécurisé - English - JEDEC
Learn More€93.50 -
JEDEC JESD 51-12.01:2012
Guidelines for Reporting and Using Electronic Package Thermal Information
11/1/2012 - PDF sécurisé - English - JEDEC
Learn More€79.20 -
JEDEC JESD 77D:2012
Terms, Definitions, and Letter Symbols for Discrete Semiconductor and Optoelectronic Devices
8/1/2012 - PDF sécurisé - English - JEDEC
Learn More€250.80 -
€73.70
-
€271.70
-
€335.50
-
JEDEC JESD 51-53:2012
Terms, Definitions and Units Glossary for LED Thermal Testing
5/1/2012 - PDF sécurisé - English - JEDEC
Learn More€61.60 -
JEDEC JESD 51-50:2012
Overview of Methodologies for the Thermal Measurement of Single- and Multi-Chip, Single- and Multi-PN-Junction Light-Emitting Diodes (LEDs)
4/1/2012 - PDF sécurisé - English - JEDEC
Learn More€58.30 -
JEDEC JESD 51-51:2012
Implementation of the Electrical Test Method for the Measurement of Real Thermal Resistance and Impedance of Light-Emitting Diodes with Exposed Cooling
4/1/2012 - PDF sécurisé - English - JEDEC
Learn More€83.60 -
JEDEC JESD 51-52:2012
Guidelines for Combining CIE 127-2007 Total Flux Measurements with Thermal Measurements of LEDs with Exposed Cooling Surface
4/1/2012 - PDF sécurisé - English - JEDEC
Learn More€64.90 -
€127.60
-
JEDEC JESD 625-B:2011
Requirements for Handling Electrostatic-Discharge-Sensitive (ESDS) Devices
12/1/2011 - PDF sécurisé - English - JEDEC
Learn More€81.40 -
EIA JEP 160:2011
Long-Term Storage for Electronic Solid-State Wafers, Dice, and Devices
11/1/2011 - PDF sécurisé - English - JEDEC
Learn More€68.68 -
JEDEC JEP 144A:2011
Guideline for Internal Gas Analysis for Microelectronic Packages
11/1/2011 - PDF sécurisé - English - JEDEC
Learn More€62.70 -
€61.60
-
€52.80
-
€61.60
-
JEDEC J-STD-101:2011
JOINT ATIS/TIA CMAS ALERT GATEWAY TO CMSP GATEWAY INTERFACE SPECIFICATION
8/1/2011 - PDF sécurisé - English - JEDEC
Learn More€440.00 -
JEDEC JESD 221:2011
Alpha Radiation Measurement in Electronic Materials
5/1/2011 - PDF sécurisé - English - JEDEC
Learn More€81.40 -
€61.60
-
JEDEC JESD 22-B118:2011 (R2016)
Semiconductor Wafer and Die Backside External Visual Inspection
3/1/2011 - PDF sécurisé - English - JEDEC
Learn More€60.48 -
€59.40
-
JEDEC J-STD-102:2011
JOINT ATIS/TIA CMAS FEDERAL ALERT GATEWAY TO CMSP GATEWAY INTERFACE TEST SPECIFICATION
1/1/2011 - PDF sécurisé - English - JEDEC
Learn More€423.50 -
JEDEC JESD 51-32:2010
EXTENSION TO JESD51 THERMAL TEST BOARD STANDARDS TO ACCOMMODATE MULTI-CHIP PACKAGES
12/1/2010 - PDF sécurisé - English - JEDEC
Learn More€56.10 -
JEDEC JESD 82-29A:2010
Definition of the SSTE32882 Registering Clock Driver with Parity and Quad Chip Selects for DDR3/DDR3L/DDR3U RDIMM 1.5 V/1.35 V/1.25 V Applications
12/1/2010 - PDF sécurisé - English - JEDEC
Learn More€127.60 -
JEDEC JESD 82-29A
DEFINITION OF THE SSTE32882 REGISTERING CLOCK DRIVER WITH PARITY AND QUAD CHIP SELECTS FOR DDR3/DDR3L/DDR3U RDIMM 1.5 V/1.35 V/1.25 V APPLICATIONS
12/1/2010 - Paper - English - JEDEC
Learn More€178.88 -
JEDEC JESD 82-29A
DEFINITION OF THE SSTE32882 REGISTERING CLOCK DRIVER WITH PARITY AND QUAD CHIP SELECTS FOR DDR3/DDR3L/DDR3U RDIMM 1.5 V/1.35 V/1.25 V APPLICATIONS
12/1/2010 - Paper and PDF - English - JEDEC
Learn More€221.52 -
JEDEC JESD 82-29A
DEFINITION OF THE SSTE32882 REGISTERING CLOCK DRIVER WITH PARITY AND QUAD CHIP SELECTS FOR DDR3/DDR3L/DDR3U RDIMM 1.5 V/1.35 V/1.25 V APPLICATIONS
12/1/2010 - PDF - English - JEDEC
Learn More€118.90 -
JEDEC JESD 51-14:2010
Transient Dual Interface Test Method for the Measurement of the Thermal Resistance Junction to Case of Semiconductor Devices with Heat Flow Trough a Single Path
11/1/2010 - PDF sécurisé - English - JEDEC
Learn More€88.00 -
JEDEC JESD 22-B108B:2010
Coplanarity Test for Surface-Mount Semiconductor Devices
9/1/2010 - PDF sécurisé - English - JEDEC
Learn More€59.40 -
JEDEC JESD 84-A441:2010
Embedded MultiMediaCard(eMMC) eMMC/Card Product Standard, High Capacity, including Reliable Write, Boot, Sleep Modes, Dual Data Rate, Multiple Partitions Supports, Security Enhancement, Background Operation and High Priority Interrupt (MMCA, 4.41)
3/1/2010 - PDF sécurisé - English - JEDEC
Learn More€262.90 -
JEDEC JESD 213:2010
Common Test Method for Detecting Component Surface Finish Materials
3/1/2010 - PDF sécurisé - English - JEDEC
Learn More€45.10 -
€155.10
-
JEDEC JESD 209B:2010
Low Power Double Data Rate (LPDDR) SDRAM Standard
2/1/2010 - PDF sécurisé - English - JEDEC
Learn More€123.20 -
JEDEC JEP 133C:2010
Guide for the Production and Acquisition of Radiation-Hardness- Assured Multichip Modules and Hybrid Microcircuits
1/1/2010 - PDF sécurisé - English - JEDEC
Learn More€82.50 -
JEDEC JESD 211:2009
Zener and Voltage Regulator Diode Rating Verification and Characterization Testing
12/1/2009 - PDF sécurisé - English - JEDEC
Learn More€75.90 -
JEDEC JEP 158:2009
3D Chip Stack with Through-Silicon Vias (TSVS): Identifying, Evaluating and Understanding Reliability Interactions
11/1/2009 - PDF sécurisé - English - JEDEC
Learn More€75.90 -
€203.50
-
€56.10
-
€63.80
-
JEDEC JESD 8-23:2009
Unified Wide Power Supply Voltage Range CMOS DC Interface Standard for Non-Terminated Digital Integrated Circuits
10/1/2009 - PDF sécurisé - English - JEDEC
Learn More€56.10 -
JEDEC J-STD-101:2009
JOINT ATIS/TIA CMAS FEDERAL ALERT GATEWAY TO CMSP GATEWAY INTERFACE SPECIFICATION
Includes all amendments and changes through Supplement B, December 2012
10/1/2009 - PDF sécurisé - English - JEDEC
Learn More€440.00 -
JEDEC JESD 84-C44:2009
Embedded MultiMediaCard (eMMC) Mechanical Standard, with Optional Reset Signal
7/1/2009 - PDF sécurisé - English - JEDEC
Learn More€57.20 -
JEDEC JESD 51-13:2009
Glossary of Thermal Measurement Terms and Definitions
6/1/2009 - PDF sécurisé - English - JEDEC
Learn More€57.20 -
€243.10
-
€321.36
-
€404.56
-
€233.70
-
JEDEC J-STD-100:2009
JOINT ATIS/TIA CMAS MOBILE DEVICE BEHAVIOR SPECIFICATION
1/30/2009 - PDF sécurisé - English - JEDEC
Learn More€154.00 -
€51.70
-
€68.20
-
€56.10
-
JEDEC JESD 201A:2008 (R2014)
Environmental Acceptance Requirements for Tin Whisker Susceptibility of Tin and Tin Alloy Surface Finishes
9/1/2008 - PDF sécurisé - English - JEDEC
Learn More€78.10 -
JEDEC JESD 82-28A:2008
Fully Buffered DIMM Design for Test, Design for Validation (DFx)
7/1/2008 - PDF sécurisé - English - JEDEC
Learn More€166.10 -
JEDEC JESD 51-31:2008
Thermal Test Environment Modifications for MultiChip Packages
7/1/2008 - PDF sécurisé - English - JEDEC
Learn More€59.40 -
€62.70
-
JEDEC JESD 22-A121A:2008 (R2014)
Test Method for Measuring Whisker Growth on Tin and Tin Alloy Surface Finishes
7/1/2008 - PDF sécurisé - English - JEDEC
Learn More€69.70 -
JEDEC JESD 8-18A:2008
FBDIMM Specification: High Speed Differential PTP Link at 1.5 V
3/1/2008 - PDF sécurisé - English - JEDEC
Learn More€107.80 -
JEDEC JESD 82.28:2008
Fully Buffered DIMM (FBDIMM): DFx Design for Validation and Test
2/1/2008 - PDF sécurisé - English - JEDEC
Learn More€166.10 -
JEDEC JEP 154:2008 (R2011)
Guideline for Characterizing Solder Bump Electromigration under Constant Current and Temperature Stress
1/1/2008 - PDF sécurisé - English - JEDEC
Learn More€83.60 -
JEDEC JESD 51-2A:2008
Integrated Circuits Thermal Test Method Environmental Conditions - Natural Convection (Still Air)
1/1/2008 - PDF sécurisé - English - JEDEC
Learn More€62.70 -
JEDEC JESD 84-A43:2007
Embedded MultiMediaCard (eMMC) eMMC/Card Product Standard, High Capacity, including Reliable Write, Boot, and Sleep Modes (MMCA, 4.3)
11/1/2007 - PDF sécurisé - English - JEDEC
Learn More€228.80 -
JEDEC JEP 114.01:2007 (R2013)
Guidelines for Particle Impact Noise Detection (PIND) Testing, Operator Training, and Certification
10/1/2007 - PDF sécurisé - English - JEDEC
Learn More€79.20 -
€143.00
-
€73.70
-
€68.20
-
JEDEC JESD 8-12A.01:2007
1.2 V +/- 0.1V (Normal Range) and 0.8 - 1.3 V (Wide Range) Power Supply Voltage and Interface Standard for Nonterminated Digital Integrated Circuits
9/1/2007 - PDF sécurisé - English - JEDEC
Learn More€45.10 -
JEDEC JESD 8C.01:2007
Interface Standard for Nominal 3 V/3.3 V Supply Digital Integrated Circuits
9/1/2007 - PDF sécurisé - English - JEDEC
Learn More€45.10 -
JEDEC JESD 8-5A.01:2007
2.5 V (PLUS OR MINUS) 0.2 V (Normal Range) and 1.8 V - 2.7 V (Wide Range) Power Supply Voltage and Interface Standard for Nonterminated Digital Integrated Circuits
9/1/2007 - PDF sécurisé - English - JEDEC
Learn More€47.30 -
JEDEC JESD 8-11A.01:2007
1.5 V +/- 0.1 V (Normal Range) and 0.9 V - 1.6 V (Wide Range) Power Supply Voltage and Interface Standard for Nonterminated Digital Integrated Circuits
9/1/2007 - PDF sécurisé - English - JEDEC
Learn More€45.10 -
JEDEC JESD 8-14A.01:2007
1.0 V +/- 0.1 V (Normal Range) and 0.7 V - 1.1 V (Wide Range) Power Supply Voltage and Interface Standard for Nonterminated Digital Integrated Circuits
9/1/2007 - PDF sécurisé - English - JEDEC
Learn More€45.10 -
JEDEC JESD8C.01
INTERFACE STANDARD FOR NOMINAL 3.0 V/3.3 V SUPPLY DIGITAL INTEGRATED CIRCUITS
9/1/2007 - Paper - English - JEDEC
Learn More€85.28 -
JEDEC JESD8C.01
INTERFACE STANDARD FOR NOMINAL 3.0 V/3.3 V SUPPLY DIGITAL INTEGRATED CIRCUITS
9/1/2007 - Paper and PDF - English - JEDEC
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JEDEC JESD8C.01
INTERFACE STANDARD FOR NOMINAL 3.0 V/3.3 V SUPPLY DIGITAL INTEGRATED CIRCUITS
9/1/2007 - PDF - English - JEDEC
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JEDEC JESD8-5A.01
ADDENDUM No. 5 to JESD8 - 2.5 V 0.2 V (NORMAL RANGE), AND 1.8 V TO 2.7 V (WIDE RANGE) POWER SUPPLY VOLTAGE AND INTERFACE STANDARD FOR NONTERMINATED DIGITAL INTEGRATED CIRCUIT
9/1/2007 - Paper - English - JEDEC
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JEDEC JESD8-5A.01
ADDENDUM No. 5 to JESD8 - 2.5 V 0.2 V (NORMAL RANGE), AND 1.8 V TO 2.7 V (WIDE RANGE) POWER SUPPLY VOLTAGE AND INTERFACE STANDARD FOR NONTERMINATED DIGITAL INTEGRATED CIRCUIT
9/1/2007 - Paper and PDF - English - JEDEC
Learn More€117.52 -
JEDEC JESD8-5A.01
ADDENDUM No. 5 to JESD8 - 2.5 V 0.2 V (NORMAL RANGE), AND 1.8 V TO 2.7 V (WIDE RANGE) POWER SUPPLY VOLTAGE AND INTERFACE STANDARD FOR NONTERMINATED DIGITAL INTEGRATED CIRCUIT
9/1/2007 - PDF - English - JEDEC
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JEDEC JESD 84-B42:2007
MultiMediaCard (MMC) Electrical Standard, High Capacity (MMCA, 4.2)
7/1/2007 - PDF sécurisé - English - JEDEC
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JEDEC JESD 84-B41:2007
MultiMediaCard (MMC) Electrical Standard, Standard Capacity (MMCA, 4.1)
6/1/2007 - PDF sécurisé - English - JEDEC
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JEDEC JESD 84-A41:2007
Embedded MultiMediaCard (eMMC) Product Standard, Standard Capacity
6/1/2007 - PDF sécurisé - English - JEDEC
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JEDEC JESD 84-A42:2007
Embedded MultiMediaCard (eMMC) Product Standard, High Capacity
6/1/2007 - PDF sécurisé - English - JEDEC
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€73.70
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JEDEC JESD 84-C43:2007
Embedded MultiMediaCard (eMMC) Mechanical Standard
6/1/2007 - PDF sécurisé - English - JEDEC
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JEDEC JESD 82-24:2007
Definition of the SSTUB32865 for DDR2 RDIMM Applications 28-bit 1:2 Registered Buffer with Parity
5/1/2007 - PDF sécurisé - English - JEDEC
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JEDEC JESD 82-10A:2007
Definition of the SSTU32866 1.8 V Configurable Registered Buffer with Parity Test for DDR2 RDIMM Applications
5/1/2007 - PDF sécurisé - English - JEDEC
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JEDEC JESD 82-25:2007
Definition of the SSTUB32866 1.8 V Configurable Registered Buffer with Parity Test for DDR2 RDIMM Applications
5/1/2007 - PDF sécurisé - English - JEDEC
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JEDEC JESD 82-9B:2007
Definition of the SSTU32865 Registered Buffer with Parity for 2R · 4 DDR2 RDIMM Applications
5/1/2007 - PDF sécurisé - English - JEDEC
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JEDEC JESD 82-23:2007
Definition of the SSTUA32S869 and SSTUA32D869 DDR2 RDIMM Applications Registered Buffer with Parity for
5/1/2007 - PDF sécurisé - English - JEDEC
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JEDEC JESD 82-16A:2007
Definition of the SSTUA32866 1.8 V Configurable Registered Buffer with Parity Test for DDR2 RDIMM Applications
5/1/2007 - PDF sécurisé - English - JEDEC
Learn More€69.30
