JEDEC
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JEDEC /ESDA JS-002-2022:2023
For Electrostatic Discharge Sensitivity Testing Charged Device Model (CDM) Device Level
1/5/2023 - Paper - English - JEDEC
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JEDEC /ESDA JS-002-2022:2023
For Electrostatic Discharge Sensitivity Testing Charged Device Model (CDM) Device Level
1/5/2023 - PDF - English - JEDEC
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€829.00
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€0.00
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€286.00
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€0.00
-
€411.00
-
€0.00
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JEDEC JEP183A:2023
Guidelines for Measuring the Threshold Voltage (VT) of SiC MOSFETs
1/1/2023 - Paper - English - JEDEC
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JEDEC JEP183A:2023
Guidelines for Measuring the Threshold Voltage (VT) of SiC MOSFETs
1/1/2023 - PDF - English - JEDEC
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€637.00
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€0.00
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€72.00
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€0.00
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JEDEC JESD47L:2022
Stress-Test-Driven Qualification of Integrated Circuits
12/1/2022 - Paper - English - JEDEC
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JEDEC JEP163:2022
SELECTION OF BURN-IN/LIFE TEST CONDITIONS AND CRITICAL PARAMETERS FOR QML MICROCIRCUITS
12/1/2022 - Paper - English - JEDEC
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JEDEC JEP163:2022
SELECTION OF BURN-IN/LIFE TEST CONDITIONS AND CRITICAL PARAMETERS FOR QML MICROCIRCUITS
12/1/2022 - PDF - English - JEDEC
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JEDEC J-STD-035A:2022
JOINT IPC/JEDEC STANDARD FOR ACOUSTIC MICROSCOPY FOR NONHERMETRIC ENCAPSULATED ELECTRONIC COMPONENTS
12/1/2022 - Paper - English - JEDEC
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JEDEC J-STD-035A:2022
JOINT IPC/JEDEC STANDARD FOR ACOUSTIC MICROSCOPY FOR NONHERMETRIC ENCAPSULATED ELECTRONIC COMPONENTS
12/1/2022 - PDF - English - JEDEC
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JEDEC J-STD-020F:2022
JOINT IPC/JEDEC STANDARD FOR Moisture/Reflow Sensitivity Classification for Non-hermetic Surface Mount Devices (SMDs)
12/1/2022 - Paper - English - JEDEC
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JEDEC J-STD-020F:2022
JOINT IPC/JEDEC STANDARD FOR Moisture/Reflow Sensitivity Classification for Non-hermetic Surface Mount Devices (SMDs)
12/1/2022 - PDF - English - JEDEC
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€170.00
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€0.00
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€502.00
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€0.00
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JEDEC JEP193:2022
Survey On Latch-Up Testing Practices and Recommendations for Improvements
12/1/2022 - Paper - English - JEDEC
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JEDEC JEP193:2022
Survey On Latch-Up Testing Practices and Recommendations for Improvements
12/1/2022 - PDF - English - JEDEC
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JEDEC JEP192:2022
Guidelines for Gate Charge (QG) Test Method for SiC MOSFET
12/1/2022 - Paper - English - JEDEC
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JEDEC JEP192:2022
Guidelines for Gate Charge (QG) Test Method for SiC MOSFET
12/1/2022 - PDF - English - JEDEC
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€94.00
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€0.00
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€86.00
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€0.00
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JEDEC JESD217A:2022
Test Methods to Characterize Voiding in Pre-SMT Ball Grid Array Packages
11/1/2022 - Paper - English - JEDEC
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JEDEC JESD217A:2022
Test Methods to Characterize Voiding in Pre-SMT Ball Grid Array Packages
11/1/2022 - PDF - English - JEDEC
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€66.00
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€0.00
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JEDEC JESD51-51A:2022
Implementation of the Electrical Test Method for the Measurement of Real Thermal Resistance and Impedance of Light-emitting Diodes with Exposed Cooling Surface
11/1/2022 - Paper - English - JEDEC
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JEDEC JESD51-51A:2022
Implementation of the Electrical Test Method for the Measurement of Real Thermal Resistance and Impedance of Light-emitting Diodes with Exposed Cooling Surface
11/1/2022 - PDF - English - JEDEC
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JEDEC JESD625C:2022
REQUIREMENTS FOR HANDLING ELECTROSTATIC-DISCHARGE-SENSITIVE (ESDS) DEVICES
10/1/2022 - Paper - English - JEDEC
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JEDEC JESD625C:2022
REQUIREMENTS FOR HANDLING ELECTROSTATIC-DISCHARGE-SENSITIVE (ESDS) DEVICES
10/1/2022 - PDF - English - JEDEC
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JEDEC JEP164:2022
System Level ESD Part III: Review of ESD Testing and Impact on System-Efficient ESD Design (SEED)
10/1/2022 - Paper - English - JEDEC
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JEDEC JEP164:2022
System Level ESD Part III: Review of ESD Testing and Impact on System-Efficient ESD Design (SEED)
10/1/2022 - PDF - English - JEDEC
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JEDEC JESD301-1A.01:2022
PMIC50x0 POWER MANAGEMENT IC SPECIFICATION, Rev. 1.83
10/1/2022 - Paper - English - JEDEC
Learn More€331.00 -
€0.00
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€331.00
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€0.00
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€203.00
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€0.00
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€455.00
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€0.00
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JEDEC JESD51-52A:2022
GUIDELINES FOR COMBINING CIE 127:2007 / 225:2017 TOTAL FLUX MEASUREMENTS WITH THERMAL MEASUREMENTS OF LEDS WITH EXPOSED COOLING SURFACE
10/1/2022 - Paper - English - JEDEC
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JEDEC JESD51-52A:2022
GUIDELINES FOR COMBINING CIE 127:2007 / 225:2017 TOTAL FLUX MEASUREMENTS WITH THERMAL MEASUREMENTS OF LEDS WITH EXPOSED COOLING SURFACE
10/1/2022 - PDF - English - JEDEC
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€192.00
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€0.00
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JEDEC JESD51-50A:2022
Overview of Methodologies for the Thermal Measurement of Single- and Multi-Chip, Single- and Multi-PN-Junction Light-Emotting Diodes (LEDs)
10/1/2022 - Paper - English - JEDEC
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JEDEC JESD51-50A:2022
Overview of Methodologies for the Thermal Measurement of Single- and Multi-Chip, Single- and Multi-PN-Junction Light-Emotting Diodes (LEDs)
10/1/2022 - PDF - English - JEDEC
Learn More€0.00 -
€521.00
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€0.00
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€100.00
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€0.00
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€395.00
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€94.00
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€0.00
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JEDEC JESD308:2022
DDR5 Unbuffered Dual Inline Memory Module (UDIMM) Common Standard
6/1/2022 - Paper - English - JEDEC
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JEDEC JESD308:2022
DDR5 Unbuffered Dual Inline Memory Module (UDIMM) Common Standard
6/1/2022 - PDF - English - JEDEC
Learn More€0.00 -
€94.00
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€0.00
-
€94.00
-
€0.00
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€89.00
-
€0.00
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€60.00
-
€88.00
-
€124.00
-
€309.00
-
€387.00
-
€223.00
-
€122.00
-
€167.00
-
€79.00
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€100.00
-
€139.00
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€72.00
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JEDEC JESD91B:2022
Method for Developing Acceleration Models for Electronic Device Failure Mechanisms
3/1/2022 - PDF - English - JEDEC
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JEDEC JESD91B:2022
Method for Developing Acceleration Models for Electronic Device Failure Mechanisms
3/1/2022 - Paper - English - JEDEC
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JEDEC JESD91B:2022
Method for Developing Acceleration Models for Electronic Device Failure Mechanisms
3/1/2022 - Paper and PDF - English - JEDEC
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JEDEC JESD402-1A:2022
Temperature Range and Measurement Standards for Components and Module
3/1/2022 - Paper - English - JEDEC
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JEDEC JESD402-1A:2022
Temperature Range and Measurement Standards for Components and Module
3/1/2022 - Paper and PDF - English - JEDEC
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JEDEC JESD402-1A:2022
Temperature Range and Measurement Standards for Components and Module
3/1/2022 - PDF - English - JEDEC
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JEDEC JEP151A:2022
Test Procedure for the Measurement of Terrestrial Cosmic Ray Induced Destructive Effects in Power Semiconductor Devices
1/1/2022 - Paper - English - JEDEC
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JEDEC JEP151A:2022
Test Procedure for the Measurement of Terrestrial Cosmic Ray Induced Destructive Effects in Power Semiconductor Devices
1/1/2022 - PDF - English - JEDEC
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€391.00
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€0.00
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JEDEC JESD22-B118A:2021
SEMICONDUCTOR WAFER AND DIE BACKSIDE EXTERNAL VISUAL INSPECTION
11/1/2021 - PDF - English - JEDEC
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€58.24
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€74.00
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€55.12
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€58.24
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JEDEC JESD89-2B:2021
Test Method for Alpha Source Accelerated Soft Error Rate
7/1/2021 - PDF - English - JEDEC
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€350.00
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JEDEC JESD22-A110E.01:2021
HIGHLY ACCELERATED TEMPERATURE AND HUMIDITY STRESS TEST (HAST)
5/1/2021 - PDF - English - JEDEC
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€55.12
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JEDEC JESD260:2021
Replay Protected Monotonic Counter (RPMC) For Serial Flash Devices
4/1/2021 - PDF - English - JEDEC
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€57.00
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JEDEC JEP178:2021
Electrostatic Discharge (ESD) Sensitivity Testing - Reporting ESD Withstand Levels on Datasheets
4/1/2021 - PDF - English - JEDEC
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€64.00
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€244.00
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€113.00
-
€264.00
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JEDEC JESD209-4-1A:2021
Addendum No. 1 to JESD209-4 - Low Power Double Data Rate 4 (LPDDR4)
2/1/2021 - PDF - English - JEDEC
Learn More€113.00 -
€55.12
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€64.00
-
€63.00
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JEDEC JESD22-A100E:2020
Cycled Temperature Humidity-Bias with Surface Condensation Life Test
11/1/2020 - PDF - English - JEDEC
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JEDEC JEP167A:2020
Characterization of Interfacial Adhesion in Semiconductor Packages
11/1/2020 - PDF - English - JEDEC
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€204.00
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JEDEC JESD22-A113I:2020
Preconditioning of Nonhermetic Surface Mount Devices Prior to Reliability Testing
4/1/2020 - PDF - English - JEDEC
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JEDEC JESD251A:2020
Expanded Serial Peripheral Interface (xSPI) for Non Volatile Memory Devices
2/1/2020 - PDF - English - JEDEC
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JEDEC JESD300-5:2020
SPD5118, SPD5108 Hub and Serial Presence Detect Device Standard
2/1/2020 - PDF - English - JEDEC
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JEDEC JEP180:2020
Guideline for Switching Reliability Evaluation Procedures for Gallium Nitride Power Conversion Devices
2/1/2020 - PDF - English - JEDEC
Learn More€79.00 -
€54.33
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€57.00
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€57.00
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€395.00
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€60.00
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JEDEC JESD220-3:2020
Universal Flash Storage (UFS) Host Performance Booster (HPB) Extension
1/1/2020 - PDF - English - JEDEC
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JEDEC JEP162A:2019
System Level ESD Part II: Implementation of Effective ESD Robust Designs
9/1/2019 - PDF - English - JEDEC
Learn More€204.00 -
€244.00
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€58.00
-
€72.00
-
€72.00
-
€64.00
-
€204.00
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ESDA/JEDEC JS-002:2018
ESDA/JEDEC Joint Standard for Electrostatic Discharge Sensitivity Testing - Charged Device Model (CDM) - Device Level
1/1/2019 - PDF - English - JEDEC
Learn More€186.76 -
EIA JESD 84-B51:2019
Embedded Multi-Media Card (e MMC) Electrical Standard (5.1)
1/1/2019 - PDF sécurisé - English - JEDEC
Learn More€300.84 -
JEDEC JESD84-B51A:2019
Embedded Multi-media card (e*MMC), Electrical Standard (5.1)
1/1/2019 - PDF - English - JEDEC
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JEDEC JEP143D:2019
SOLID STATE RELIABILITY ASSESSMENT QUALIFICATION METHODOLOGIES
1/1/2019 - PDF - English - JEDEC
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€77.00
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JEDEC JESD22-A117E:2018
ELECTRICALLY ERASABLE PROGRAMMABLE ROM (EEPROM) PROGRAM/ERASE ENDURANCE AND DATA RETENTION TEST
11/1/2018 - PDF - English - JEDEC
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€57.00
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JEDEC JESD251-1:2018
Addendum No. 1 to JESD251, Optional x4 Quad I/O With Data Strobe
10/1/2018 - PDF - English - JEDEC
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JEDEC JEP001-3A:2018
FOUNDRY PROCESS QUALIFICATION GUIDELINES - PRODUCT LEVEL (Wafer Fabrication Manufacturing Sites)
9/1/2018 - PDF - English - JEDEC
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JEDEC JEP001-2A:2018
FOUNDRY PROCESS QUALIFICATION GUIDELINES - FRONT END TRANSISTOR LEVEL (Wafer Fabrication Manufacturing Sites)
9/1/2018 - PDF - English - JEDEC
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JEDEC JEP001-1A:2018
FOUNDRY PROCESS QUALIFICATION GUIDELINES - BACKEND OF LINE (Wafer Fabrication Manufacturing Sites)
9/1/2018 - PDF - English - JEDEC
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JEDEC JESD22-B113B:2018
BOARD LEVEL CYCLIC BEND TEST METHOD FOR INTERCONNECT RELIABILITY CHARACTERIZATION OF SMT ICS FOR HANDHELD ELECTRONIC PRODUCTS
8/1/2018 - PDF - English - JEDEC
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€77.00
-
€97.00
-
JEDEC JESD671C:2018
Component Quality Problem Analysis and Corrective Action Requirements (Including Administrative Quality Problems)
7/1/2018 - PDF - English - JEDEC
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JEDEC J-STD-033D:2018
Handling, Packing, Shipping, and Use of Moisture/Reflow Sensitive Surface-Mount Devices
4/1/2018 - PDF - English - JEDEC
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JEDEC JESD22-A111B:2018
EVALUATION PROCEDURE FOR DETERMINING CAPABILITY TO BOTTOM SIDE BOARD ATTACH BY FULL BODY SOLDER IMMERSION OF SMALL SURFACE MOUNT SOLID STATE DEVICES
3/1/2018 - PDF - English - JEDEC
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JEDEC JESD72A:2018
TEST METHODS AND ACCEPTANCE PROCEDURES FOR THE EVALUATION OF POLYMERIC MATERIALS
3/1/2018 - PDF - English - JEDEC
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JEDEC JEP156A:2018
CHIP-PACKAGE INTERACTION UNDERSTANDING, IDENTIFICATION AND EVALUATION
3/1/2018 - PDF - English - JEDEC
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JEDEC JS709C:2018
Joint JEDEC/ECA Standard: Definition of "Low-Halogen" for Electronic Products
3/1/2018 - PDF - English - JEDEC
Learn More€64.00 -
€86.00
-
€51.00
-
€66.00
-
JEDEC JESD88F:2018
JEDEC Dictionary of Terms for Solid-State Technology, 7th Edition
2/1/2018 - PDF - English - JEDEC
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JEDEC JESD 251:2018
EXpanded Serial Peripheral Interface (xSPI) for Non Volatile Memory Devices
1/8/2018 - PDF sécurisé - English - JEDEC
Learn More€127.60 -
€390.50
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JEDEC JESD 223D:2018
Universal Flash Storage Host Controller Interface (UFSHCI) Version 3.0
1/1/2018 - PDF sécurisé - English - JEDEC
Learn More€155.10 -
€66.00
-
€66.00
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JEDEC JESD50C:2018
SPECIAL REQUIREMENTS FOR MAVERICK PRODUCT ELIMINATION AND OUTLIER MANAGEMENT
1/1/2018 - PDF - English - JEDEC
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JEDEC JESD223D:2018
Universal Flash Storage Host Controller Interface (UFSHCI)
1/1/2018 - PDF - English - JEDEC
Learn More€151.00 -
€335.50
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JEDEC JESD69C:2017
INFORMATION REQUIREMENTS FOR THE QUALIFICATION OF SILICON DEVICES
11/1/2017 - PDF - English - JEDEC
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JEDEC JESD16B:2017
ASSESSMENT OF AVERAGE OUTGOING QUALITY LEVELS IN PARTS PER MILLION (PPM)
11/1/2017 - PDF - English - JEDEC
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€210.10
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JEDEC JESD 30H:2017
Descriptive Designation System for Electronic-device Packages
8/1/2017 - PDF sécurisé - English - JEDEC
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JEDEC JESD30H:2017
Descriptive Designation System for Semiconductor-device Packages
8/1/2017 - PDF - English - JEDEC
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JEDEC JESD37A:2017
Lognormal Analysis of Uncensored Data, and of Singly Right-Censored Data Utilizing the Persson and Rootzen Method
8/1/2017 - PDF - English - JEDEC
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JEDEC JESD214.01:2017
CONSTANT-TEMPERATURE AGING METHOD TO CHARACTERIZE COPPER INTERCONNECT METALLIZATIONS FOR STRESS-INDUCED VOIDING
8/1/2017 - PDF - English - JEDEC
Learn More€77.00 -
€335.50
-
€326.00
-
€60.00
-
€258.50
-
€312.40
-
€304.00
-
JEDEC JS-001-2017
ESDA/JEDEC Joint Standard for Electrostatic Discharge Sensitivity Testing - Human Body Modal (HBM) - Component Level
5/12/2017 - PDF - English - JEDEC
Learn More€97.00 -
€79.00
-
JEDEC JESD 9C:2017
Inspection Criteria for Microelectronic Packages and Covers
5/1/2017 - PDF sécurisé - English - JEDEC
Learn More€155.10 -
JEDEC JESD9C:2017
Inspection Criteria for Microelectronic Packages and Covers
5/1/2017 - PDF - English - JEDEC
Learn More€151.00 -
€60.00
-
JEDEC JESD213A:2017
STANDARD TEST METHOD UTILIZING X-RAY FLUORESCENCE (XRF) FOR ANALYZING COMPONENT FINISHES AND SOLDER ALLOYS TO DETERMINE TIN (Sn) - LEAD (Pb) CONTENT
4/1/2017 - PDF - English - JEDEC
Learn More€64.00 -
JEDEC JESD210A:2017
AVALANCHE BREAKDOWN DIODE (ABD) TRANSIENT VOLTAGE SUPPRESSORS
3/1/2017 - PDF - English - JEDEC
Learn More€86.00 -
€335.50
-
€58.00
-
€210.10
-
€72.00
-
JEDEC JESD31E:2016
GENERAL REQUIREMENTS FOR DISTRIBUTORS OF COMMERCIAL AND MILITARY SEMICONDUCTOR DEVICES
11/1/2016 - PDF - English - JEDEC
Learn More€79.00 -
€83.00
-
JEDEC JESD22-B111A:2016
BOARD LEVEL DROP TEST METHOD OF COMPONENTS FOR HANDHELD ELECTRONIC PRODUCTS
11/1/2016 - PDF - English - JEDEC
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JEDEC JEP130B:2016
GUIDELINES FOR PACKING AND LABELING OF INTEGRATED CIRCUITS IN UNIT CONTAINER PACKING (TUBES, TRAYS, AND TAPE AND REEL)
11/1/2016 - PDF - English - JEDEC
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JEDEC JESD22-B106E:2016
RESISTANCE TO SOLDER SHOCK FOR THROUGH-HOLE MOUNTED DEVICES
11/1/2016 - PDF - English - JEDEC
Learn More€58.00 -
€174.00
-
JEDEC JEP 122H:2016
Failure Mechanisms and Models for Semiconductor Devices
9/1/2016 - PDF sécurisé - English - JEDEC
Learn More€179.30 -
€228.80
-
€60.00
-
€223.00
