| Name | Support | Language | Availability | Edition date | Price | ||
|---|---|---|---|---|---|---|---|
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PDF |
English |
Active |
9/16/2019 |
€40.00 |
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Details
Part 3 of this test method standard establishes uniform test methods for the electrical testing (digital) to determine resistance to deleterious effects of natural elements and conditions surrounding military operations. For the purpose of this standard, the term "devices" includes such items as monolithic, multichip, film and hybrid microcircuits, microcircuit arrays, and the elements from which the circuits and arrays are formed. This standard is intended to apply only to microelectronic devices.
Additional Info
| Author | U.S. Department of Defense (DoD) |
|---|---|
| Published by | DODNAV |
| Document type | Standard |
| ICS | 31.200 : Integrated circuits. Microelectronics
|
| Number of pages | 89 |
| Replace | MIL-STD-883K:2018 |
