MIL-STD-750-2B:2022 & C1:2023

MIL-STD-750-2B:2022 & C1:2023

Mechanical Test Methods for Semiconductor Devices Part 2: Test Methods 2001 through 2999

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Details

Part 2 of this test method standard establishes uniform test methods for the mechanical testing of semiconductor devices to determine resistance to deleterious effects of natural elements and conditions surrounding military operations. For the purpose of this standard, the term "devices" includes such items as transistors, diodes, voltage regulators, rectifiers, tunnel diodes, and other related devices. This part of a multipart test method standard is intended to apply only to semiconductor devices.

Additional Info

Author U.S. Department of Defense (DoD)
Published by DODNAV
Document type Standard
Edition B
ICS 31.080.01 : Semiconductor devices in general
Number of pages 331
Replace MIL-STD-750-2A:2015 + C1:2015, C2:2016, C3:2018, C4:2020 & C5:2021
Modified by Change 1 (change incorporated):23.06.2023