Name | Support | Language | Availability | Edition date | Price | ||
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PDF |
English |
Active |
6/22/2022 |
€70.00 |
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Details
Part 2 of this test method standard establishes uniform test methods for the mechanical testing of semiconductor devices to determine resistance to deleterious effects of natural elements and conditions surrounding military operations. For the purpose of this standard, the term "devices" includes such items as transistors, diodes, voltage regulators, rectifiers, tunnel diodes, and other related devices. This part of a multipart test method standard is intended to apply only to semiconductor devices.
Additional Info
Author | U.S. Department of Defense (DoD) |
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Published by | DODNAV |
Document type | Standard |
Edition | B |
ICS | 31.080.01 : Semiconductor devices in general
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Number of pages | 331 |
Replace | MIL-STD-750-2A:2015 + C1:2015, C2:2016, C3:2018, C4:2020 & C5:2021 |
Modified by | Change 1 (change incorporated):23.06.2023 |