JIS H 0614:1996 (R2015)

JIS H 0614:1996 (R2015)

Visual inspection for silicon wafers with specular surfaces

€25.00

Additional Info

Author Japanese Industrial Standard (JIS) / Japanese Standards Association (JSA)
Published by JSA
Document type Standard
Confirmation date 2015-10-20
ICS 29.045 : Semiconducting materials
77.120.99 : Other non-ferrous metals and their alloys
Number of pages 8
Document history
Keyword JIS 0614,0614,JIS H 0614-1996