| Name | Support | Language | Availability | Edition date | Price | ||
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PDF |
English |
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10/1/2015 |
€86.00 |
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Details
The method described in this document applies to all application specific reliability testing for solid state components with known failure mechanisms where the test duration and conditions vary based on application variables. This document does not cover reliability tests that are characterization based or essentially go / no-go type tests, for example, ESD, latch-up, or electrical over stress. Also, it does not attempt to cover every failure mechanism or test environment, but does provide a methodology that can be extended to other failure mechanisms and test environments.
Additional Info
| Author | JEDEC Solid State Technology Association |
|---|---|
| Published by | JEDEC |
| Document type | Standard |
| Theme | /subgroups/36080 |
| Confirmation date | 2021-01-01 |
| ICS | 31.020 : Electronic components in general
|
| Number of pages | 47 |
| Replace | JEDEC JESD94A |
| Keyword | JEDEC JESD94B |
