JEDEC JESD89-3B:2021

JEDEC JESD89-3B:2021

Test Method for Beam Accelerated Soft Error Rate



This test is used to determine the terrestrial cosmic ray Soft Error Rate (SER) sensitivity of solid state volatile memory arrays and bistable logic elements (e.g., flip-flops) by measuring the error rate while the device is irradiated in a neutron or proton beam of known flux. The results of this accelerated test can be used to estimate the terrestrial cosmic ray induced SER for a given terrestrial cosmic ray radiation environment. This test cannot be used to project alpha-particle induced SER.

Additional Info

Author JEDEC Solid State Technology Association
Published by JEDEC
Document type Standard
Theme /subgroups/36080
ICS 31.080.01 : Semiconductor devices in general
Number of pages 16
Replace JEDEC JESD89-3A:2007 (R2012)
Keyword JEDEC JESD89-1A