Name | Support | Language | Availability | Edition date | Price | ||
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English |
Active |
7/1/2021 |
€58.24 |
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PDF |
English |
Active |
7/1/2021 |
€58.24 |
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PDF |
English |
Active |
9/1/2021 |
€58.24 |
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Details
This test is used to determine the terrestrial cosmic ray Soft Error Rate (SER) sensitivity of solid state volatile memory arrays and bistable logic elements (e.g., flip-flops) by measuring the error rate while the device is irradiated in a neutron or proton beam of known flux. The results of this accelerated test can be used to estimate the terrestrial cosmic ray induced SER for a given terrestrial cosmic ray radiation environment. This test cannot be used to project alpha-particle induced SER.
Additional Info
Author | JEDEC Solid State Technology Association (JEDEC) |
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Published by | JEDEC |
Document type | Standard |
Theme | /subgroups/36080 |
ICS | 31.080.01 : Semiconductor devices in general
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Number of pages | 16 |
Replace | JEDEC JESD89-3A:2007 (R2012) |
Keyword | JEDEC JESD89-1A |