JEDEC JESD89-3B:2021

JEDEC JESD89-3B:2021

Test Method for Beam Accelerated Soft Error Rate

€58.24

Details

This test is used to determine the terrestrial cosmic ray Soft Error Rate (SER) sensitivity of solid state volatile memory arrays and bistable logic elements (e.g., flip-flops) by measuring the error rate while the device is irradiated in a neutron or proton beam of known flux. The results of this accelerated test can be used to estimate the terrestrial cosmic ray induced SER for a given terrestrial cosmic ray radiation environment. This test cannot be used to project alpha-particle induced SER.

Additional Info

Author JEDEC Solid State Technology Association
Published by JEDEC
Document type Standard
Theme /subgroups/36080
ICS 31.080.01 : Semiconductor devices in general
Number of pages 16
Replace JEDEC JESD89-3A:2007 (R2012)
Keyword JEDEC JESD89-1A