JEDEC JESD89-2B:2021

JEDEC JESD89-2B:2021

Test Method for Alpha Source Accelerated Soft Error Rate



This test method is offered as standardized procedure to determine the alpha particle Soft Error Rate (SER) sensitivity of solid state volatile memory arrays and bistable logic elements (e.g. flipflops) by measuring the error rate while the device is irradiated by a characterized, solid alph source.

Additional Info

Author JEDEC Solid State Technology Association
Published by JEDEC
Document type Standard
Theme /subgroups/36080
ICS 31.080.01 : Semiconductor devices in general
Number of pages 16
Replace JEDEC JESD89-2A:2007 (R2012)
Keyword JEDEC JESD89-1A