| Name | Support | Language | Availability | Edition date | Price | ||
|---|---|---|---|---|---|---|---|
|
PDF |
English |
Active |
3/1/2014 |
€72.00 |
|
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Details
This standard is intended to identify a core set of qualification tests that apply specifically for Power Amplifier Modules and their primary application in mobile devices such as cellular phones. This standard is intended to describe specific stresses and failure mechanisms that are specific to compound semiconductors and power amplifier modules. It is intended to establish more meaningful and efficient qualification testing.
Additional Info
| Author | JEDEC Solid State Technology Association |
|---|---|
| Published by | JEDEC |
| Document type | Standard |
| Theme | /subgroups/37160 |
| Number of pages | 24 |
| Keyword | JEDEC JESD237 |
