JEDEC JEP174:2016

JEDEC JEP174:2016

UNDERSTANDING ELECTRICAL OVERSTRESS - EOS

€223.00

Details

The purpose of this white paper will be to introduce a new perspective about EOS to the electronics industry. As failures exhibiting EOS damage are commonly experienced in the industry, and these severe overstress events are a factor in the damage of many products, the intent of the white paper is to clarify what EOS really is and how it can be mitigated once it is properly comprehended.

Additional Info

Author JEDEC Solid State Technology Association
Published by JEDEC
Document type Standard
Theme /subgroups/36943
Number of pages 174
Keyword JEDEC JEP174