IEEE 1671.3:2017

IEEE 1671.3:2017

IEEE Standard for Automatic Test Markup Language (ATML) Unit Under Test (UUT) Description

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Details

Revision Standard - Active.
An exchange format utilizing Extensible Markup Language (XML) for both the static description of unit under test (UUT) and the specific description of UUT instance information is defined in this standard.

This standard defines an exchange format, utilizing Extensible Markup Language (XML), for both the static description of a UUT and the specific description of UUT instance information.
No purpose statement is required since this standard is intended for IEC standardization.

Additional Info

Author Institute of Electrical and Electronics Engineers (IEEE)
Committee SCC20 - Test and Diagnosis for Electronic Systems
Published by IEEE
Document type Standard
Edition
EAN ISBN 978-1-5044-4567-2
ICS 35.240.30 : IT applications in information, documentation and publishing
Number of pages 104
Replace IEEE 1671.3:2007
Keyword IEEE 1671.3-2017
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