IEC TS 63342:2022

IEC TS 63342:2022

IEC TS 63342:2022 C-Si photovoltaic (PV) modules - Light and elevated temperature induced degradation (LETID) test - Detection

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Details

IEC TS 63342:2022 is designed to assess the effect of light induced degradation at elevated temperatures (LETID) by application of electrical current at higher temperatures. In this document, only the current injection approach for the detection of LETID is addressed.
This document does not address the B-O and Iron Boron (Fe-B) related degradation phenomena, which already occur at room temperatures under the presence of light and on much faster time scales. The proposed test procedure can reveal sample sensitivity to LETID degradation mechanisms, but it does not provide an exact measure of field observable degradation.

Additional Info

Author International Electrotechnical Commission (IEC)
Committee TC 82
Published by IEC
Document type Standard
Edition 1.0
ICS 27.160 : Solar energy engineering
Number of pages 13
Keyword IEC63342,IEC TS 63342:2022,IEC/TS 63342,TC 82