Name | Support | Language | Availability | Edition date | Price | ||
---|---|---|---|---|---|---|---|
PDF |
English |
Active |
10/27/2020 |
€219.00 |
|
Details
IEC TS 62607-6-14:2020 establishes a standardized method to determine the structural key control characteristic
• defect level
for powders consisting of graphene-based material by
• Raman spectroscopy.
The defect level is derived by the intensity ratio of the D+D' band and 2D band in Raman spectrum, ID+D'/I2D.
• The defect level determined in accordance with this document will be listed as a key control characteristic in the blank detail specification for graphene IEC 62565-3-1 for graphene powder.
• The method is applicable for graphene powder or graphene-based material, e.g. reduced graphene oxide (rGO), bilayer graphene, trilayer graphene and few-layer graphene.
• Typical application areas are quality control and classification for graphene manufacturers, and product selection for downstream users.
• The method described in this document is appropriate if the physical form of graphene is powder.
Additional Info
Author | International Electrotechnical Commission (IEC) |
---|---|
Committee | TC 113 |
Published by | IEC |
Document type | Standard |
Edition | 1.0 |
ICS | 07.120 : Nanotechnologies
|
Number of pages | 28 |
Keyword | IEC62607-6-14,IEC TS 62607-6-14:2020,IEC/TS 62607-6-14,TC 113 |