IEC TS 62607-6-14:2020

IEC TS 62607-6-14:2020

IEC TS 62607-6-14:2020 Nanomanufacturing - Key control characteristics - Part 6-14: Graphene-based material - Defect level: Raman spectroscopy

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Details

IEC TS 62607-6-14:2020 establishes a standardized method to determine the structural key control characteristic
• defect level
for powders consisting of graphene-based material by
• Raman spectroscopy.
The defect level is derived by the intensity ratio of the D+D' band and 2D band in Raman spectrum, ID+D'/I2D.
• The defect level determined in accordance with this document will be listed as a key control characteristic in the blank detail specification for graphene IEC 62565-3-1 for graphene powder.
• The method is applicable for graphene powder or graphene-based material, e.g. reduced graphene oxide (rGO), bilayer graphene, trilayer graphene and few-layer graphene.
• Typical application areas are quality control and classification for graphene manufacturers, and product selection for downstream users.
• The method described in this document is appropriate if the physical form of graphene is powder.

Additional Info

Author International Electrotechnical Commission (IEC)
Committee TC 113
Published by IEC
Document type Standard
Edition 1.0
ICS 07.120 : Nanotechnologies
Number of pages 28
Keyword IEC62607-6-14,IEC TS 62607-6-14:2020,IEC/TS 62607-6-14,TC 113