| Name | Support | Language | Availability | Edition date | Price | ||
|---|---|---|---|---|---|---|---|
|
PDF |
English |
Active |
4/14/2020 |
€132.00 |
|
||
Details
IEC TS 62607-5-3:2020 specifies sample structures for evaluating a wide range of charge carrier concentration in organic/nano materials. This specification is provided for both capacitance-voltage (C-V) measurements in metal/insulator/semiconductor stacking structures and Hall-effect measurements with the van der Pauw configuration. Criteria for choosing measurement methods of charge carrier concentration in organic semiconductor layers are also given in this document.
Additional Info
| Author | International Electrotechnical Commission (IEC) |
|---|---|
| Committee | TC 113 |
| Published by | IEC |
| Document type | Standard |
| Edition | 1.0 |
| ICS | 07.030 : Physics. Chemistry
07.120 : Nanotechnologies |
| Number of pages | 20 |
| Keyword | IEC62607-5-3,IEC TS 62607-5-3:2020,IEC/TS 62607-5-3,TC 113 |
